Time-of-flight mass spectrometer
AssigneeShimadzu Corporation
InventorRyo Fujita
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AssigneeShimadzu Corporation
InventorRyo Fujita
Estimating the term…
A shielding plate 6 having a forward-side slit opening 61 and return-side slit opening 62 is placed in a free flight space 3 with no electric field. Ions which significantly deviate from a reference path are removed by the shielding plate 6 on both the forward-side and return-side paths. The opening width of the forward-side slit opening 61 is smaller than that of the return-side slit opening 62. Those opening widths and the placement position of the shielding plate 6 are determined based on the result of an ion trajectory calculation by accurate simulation. As compared to a conventional device with a shielding plate placed only on the return side, the present configuration allows for an increase in the opening width of the return-side slit opening while achieving the same level of resolving power. The ion transmission ratio is thereby improved, and the analytical sensitivity is enhanced.
A reflectron time-of-flight mass spectrometer including:
A reflectron time-of-flight mass spectrometer including:
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