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US 10,379,955 B2Granted
Memory system and operating method thereof
AssigneeSK hynix Inc.
InventorsYong-Tae Kim, Soong-Sun Shin, Duck-Hoi Koo
Life of this patent
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Abstract
A memory system may include: a memory device including a plurality of storage regions; and a controller. The controller may be coupled between a host and the memory device, and perform a read retry operation when a read error occurs in any one of the storage regions based on occurrence possibilities for a plurality of different type of defects in any one storage region where a read error occurred.
Claims20
A memory system comprising:
- a memory device including a plurality of storage regions;
- and
- a controller coupled between a host and the memory device, and configured to provide a read retry table including a plurality of read retry sets, each corresponding to each of a plurality of different defects, determine whether a read error occurs in any one of the storage regions, determine occurrence possibilities, each corresponding to each of the plurality of different defects, determine an order in which the plurality of read retry sets is applied based on the occurrence possibilities, and perform a read retry operation based on the order.
A memory controller comprising:
- a read retry table including a plurality of read retry sets, each corresponding to each of a plurality of different defects;
- and
- a processor configured to:
- determine whether a read error occurs in any one of a plurality of storage regions included in a memory device;
- determine occurrence possibilities, each corresponding to each of the plurality of different defects;
- determine an order in which the plurality of read retry sets is applied based on the occurrence possibilities;
- and
- perform a read retry operation based on the order.
5 more elements
An operating method of a memory controller, comprising:
- providing a read retry table including a plurality of read retry sets, each corresponding to each of a plurality of different defects;
- determining whether a read error occurs in any one of a plurality of storage regions included in a memory device;
- determining occurrence possibilities, each corresponding to each of the plurality of different defects;
- determining an order in which the plurality of read retry sets is applied based on the occurrence possibilities;
- and
- performing a read retry operation based on the order.
3 more elements
Dependencies are inferred from the claim text.