Memory apparatus for in-chip error correction
AssigneeSamsung Electronics Co., Ltd.
InventorsKrishna T. Malladi, Hongzhong Zheng
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AssigneeSamsung Electronics Co., Ltd.
InventorsKrishna T. Malladi, Hongzhong Zheng
Estimating the term…
A method of performing memory deduplication and single error correction double error detection (SEC-DED) in a computer memory, the method including reading data from an array of memory chips, calculating at least one hash based on the data, checking the one or more hashes against at least one of a physical line ID hash and against a secondary hash, determining whether an error is detected, when an error is detected, correcting the data by changing each bit of the array of the memory chips one at a time until no error is detected, wherein between changing each bit, at least one hash is calculated based on the changed data, and the one or more hash for the new data is compared against one or more of a physical line ID hash and against a secondary hash, and again determining whether an error is detected, and outputting the corrected data when no error is detected.
A method of reducing access latency and improving data integrity by performing memory deduplication and single error correction double error detection (SEC-DED) in a computer memory, the method comprising:
A method of reducing access latency and improving data integrity by performing memory deduplication and a single chipkill mechanism in a computer memory, the method comprising:
A method of reducing access latency and improving data integrity by performing memory deduplication and a double chipkill mechanism in a computer memory, the method comprising:
Dependencies are inferred from the claim text.