Data storage device read threshold adjustment according to environmental parameters
AssigneeWestern Digital Technologies, Inc.
InventorsAlexander Bazarsky, Dudy Avraham, Eran Sharon
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AssigneeWestern Digital Technologies, Inc.
InventorsAlexander Bazarsky, Dudy Avraham, Eran Sharon
Estimating the term…
Embodiments of systems and methods for management and/or optimization of non-volatile memory read thresholds using improved time and temperature tagging are described. In some embodiments, time and temperature tagging can be optimized based on time that it takes to perform read threshold calibration, the expected change in temperature, and/or the impact of this change on bit error rate. In some embodiments, a model of an environmental parameter can be determined and associated read thresholds can be pre-calculated. If the measured environmental parameter is within a threshold of the model for the environmental parameter, a pre-calculated read threshold value can be used instead of performing read threshold calibration. Advantageously, power consumption can be reduced and throughput for the memory device can be increased.
A storage device comprising:
A storage device comprising:
A method of operating a storage device comprising a plurality of non-volatile solid-state memory cells and a controller, the method comprising, by the controller:
Dependencies are inferred from the claim text.