Methods and devices for estimating weight of an object to be inspected in an inspection system

A device for estimating a weight of an object to be inspected in an inspection system, the device comprising:

• one or more processors;
• and
• a memory connected to the one or more processors and having one or more programs stored therein, which, when executed by the one or more processors, cause the one or more processors to be configured to:
• obtain an effective atomic number and a dual-energy high-energy grayscale feature value corresponding to each pixel of the object to be inspected by a dual-energy radiation scanning;
• obtain a mass-thickness value for a corresponding pixel from a pre-created mass-thickness attenuation curve by utilizing the effective atomic number and the dual-energy high-energy grayscale feature value for respective pixels;
• and
• calculate weight information for at least a part of the object to be inspected by multiplying the mass-thickness value by an area of the pixel.

A method for estimating a weight of an object to be inspected in an inspection system, the method comprising:

• obtaining a grayscale feature value corresponding to each pixel of an object to be inspected by a single-energy radiation scanning;
• obtaining a mass-thickness value for a corresponding pixel from a pre-created mass-thickness attenuation curve by utilizing the grayscale feature value corresponding to respective pixels;
• and
• calculating weight information for at least a part of the object to be inspected by multiplying the mass-thickness value by an area of the pixel.

A device for estimating a weight of an object to be inspected in an inspection system, the device comprising:

• one or more processors;
• and
• a memory connected to the one or more processors and having one or more programs stored therein, which, when executed by the one or more processors, cause the one or more processors to be configured to:
• obtain a grayscale feature value corresponding to each pixel of an object to be inspected by a single-energy radiation scanning;
• obtain a mass-thickness value for a corresponding pixel from a pre-created mass-thickness attenuation curve by utilizing the grayscale feature value corresponding to respective pixels;
• and
• calculate weight information for at least a part of the object to be inspected by multiplying the mass-thickness value by an area of the pixel.