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US 10,379,230 B2Granted
Chalco-phosphate-based hard radiation detectors
AssigneeNorthwestern University
InventorsMercouri G. Kanatzidis, Peng L. Wang, Bruce W. Wessels, Zhifu Liu
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Abstract
Methods and devices for detecting incident radiation, such as incident x-rays or gamma-rays, are provided. The methods and devices use high purity, high quality single-crystals of inorganic semiconductor compounds having the formula A2P2X6, where A represents Pb or Sn and X represents S or Se, as photoelectric materials.
Claims20
A method for detecting incident radiation, the method comprising:
- exposing a material comprising an inorganic compound having the formula A2P2X6, where A represents Pb or Sn and X represents S or Se, to incident gamma radiation, x-ray radiation, or a combination thereof, wherein the material absorbs the incident radiation and electron-hole pairs are generated in the material;
- and
- measuring at least one of the energy or intensity of the absorbed incident radiation by detecting the generated electrons, holes, or both.
A device for the detection of incident radiation comprising:
- a material comprising an inorganic compound having the formula A2P2X6, where A represents Pb or Sn and X represents S or Se;
- a first electrode in electrical communication with the material;
- a second electrode in electrical communication with the material, wherein
- the first and second electrodes are configured to apply an electric field across the material;
- and
- a detector configured to measure a signal generated by electron-hole pairs that are formed when the material is exposed to incident gamma radiation, x-ray radiation, or a combination thereof.
3 more elements
Dependencies are inferred from the claim text.