US 10,379,159 B1 · Minimization of over-masking in an on product multiple input signature register (OPMISR)

Abstract

A method and circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test due to Channel Mask Enable (CME) sharing, and a design structure on which the subject circuit resides. A common Channel Mask Scan Registers (CMSR) logic is used with a multiple input signature register (MISR). Individual local addressing is used for implementing enhanced scan data testing. An architecture and algorithm efficiently expand and target the use of the CME pins to minimize over-masking, to increase test pattern effectiveness with the use of individual local addressing.

Claims20

Dependent claims

A method for implementing enhanced scan data testing with over masking minimization in an on product multiple input signature register (OPMISR) comprising:

providing one or more OPMISR satellites, each of the one or more OPMISR satellites including a multiple input signature register (MISR) for data collection and a plurality of associated scan channels;
providing common Channel Mask Scan Registers (CMSR) logic with the multiple input signature register (MISR);
using individual local addressing for implementing enhanced scan data testing;
and
expanding and targeting use of Channel Mask Enable (CME) pins to minimize over-masking, to increase test pattern effectiveness with the use of individual local addressing.

2 more elements

Dependencies are inferred from the claim text.

Minimization of over-masking in an on product multiple input signature register (OPMISR)

Life of this patent

Minimization of over-masking in an on product multiple input signature register (OPMISR)

Life of this patent

Abstract

Claims20