US 10,379,157 B2 · Test pad and method for determining positions of probes

Abstract

A system for determining a position of a test probe of a test fixture applied to a test pad on a dummy board is disclosed. The test pad includes conductive test zones, resistors, a first insulating zone, and a plurality of second insulating zones. Each resistor has a different resistance. Each resistor is connected to a different test zone. The test zones include a first test zone and a surrounding plurality of second test zones. The first test zone is insulated from the second test zones by the first insulating zone. Adjacent second test zones are insulated from each other by a different second insulating zone. Probe correction can be carried out according to the value of resistance read by a resistance measuring device which stores a correspondence table, and position of the probe adjusted accordingly.

Claims13

Dependent claims

A test pad provided on a dummy board, and being used to determine a position of a probe of a test fixture, the test pad comprising:

a plurality of conductive test zones, a plurality of resistors, a first insulating zone, and a plurality of second insulating zones;
wherein each one of the resistors has a different resistance, and each one of the resistors is connected to a different one of the test zones;
wherein the test zones comprise a first test zone and a plurality of second test zones, the second test zones are disposed around the first test zone, the first test zone is insulated from the second test zones by the first insulating zone, and adjacent second test zones are insulated from each other by a different one of the second insulating zones;
and
wherein the first test zone is circular and has a diameter of 0.28 mm.

2 more elements

Dependencies are inferred from the claim text.

Test pad and method for determining positions of probes

Life of this patent

Test pad and method for determining positions of probes

Life of this patent

Abstract

Claims13