In-die transistor characterization in an IC

A system to test an integrated circuit (IC) having programmable logic coupled to programmable interconnect formed on a die of the IC, the system comprising:

• a plurality of transistor modules disposed in a plurality of locations on the die of the IC and coupled to the programmable interconnect;
• a control circuit on the die of the IC and coupled to the plurality of transistor modules, configured to drive the plurality of transistor modules to obtain test measurements;
• and
• a test circuit on the die of the IC and coupled to the control circuit, configured to derive transistor characteristics from the test measurements, wherein the test circuit is configured in the programmable logic.

A method of testing an integrated circuit (IC) having programmable logic coupled to programmable interconnect formed on a die of the IC, the method comprising:

• driving voltage signals to a plurality of transistors, disposed in a plurality of locations on the die of the IC and coupled to the programmable interconnect, using a digital-to-analog converter (DAC) on the IC;
• generating samples in response to induced current signals in the plurality of transistors in using an analog-to-digital converter (ADC) on the die of the IC;
• configuring the programmable logic of the IC to implement a test circuit;
• receiving the samples at the test circuit;
• and
• deriving at least one electrostatic characteristic for the plurality of transistors from the samples.