Testing system and method
AssigneeXcerra Corporation
InventorsBenjamin Brown, Niraj Rangwala, David McConnell, Howard Massenn
Life of this patent
Estimating the term…
Abstract
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
Claims16
An automated test platform for testing at least one device under test, the automated test platform comprising:
- a test head configured to receive the at least one device under test;
- a processing system configured to:
- provide a voltage signal having a plurality of voltages to the at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,
- monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and
- store the plurality of monitored current values.
A computer-implemented method, executed on a computing device, the computer-implemented method comprising:
- providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,
- monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and
- storing the plurality of monitored current values.
A computing system including a processor and memory configured to perform operations comprising:
- providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,
- monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and
- storing the plurality of monitored current values.
An apparatus comprising:
- means for providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,
- means for monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and
- means for storing the plurality of monitored current values.
Dependencies are inferred from the claim text.