Methods, systems and devices for testing circuit modules using a microbackplane interface
AssigneeWestern Digital Technologies, Inc.
InventorsSohail Mallick, Dmitry Vaysman, Hyun Soo Kim, Brian Hokyee Tse, Hariharan Venkataramani
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Abstract
Systems and methods are disclosed for testing circuit modules. A system for testing a circuit module includes a test circuit board configured to interface with a host system, a standard connector implemented on the test circuit board and configured to be attachably coupled to the circuit module, a micro-backplane module configured to be attachably coupled to the circuit module and a micro-backplane module interface connector implemented on the test circuit board and configured to be attachably coupled to the micro-backplane module.
Claims25
A system, comprising:
- a test circuit board configured to interface with a host system;
- a standard connector implemented on the test circuit board and configured to be attachably coupled to a circuit module, wherein the circuit module includes a solid state device (SSD);
- a micro-backplane module configured to be attachably coupled to the circuit module;
- and
- a micro-backplane module interface connector implemented on the test circuit board and configured to be attachably coupled to the micro-backplane module, wherein the micro-backplane module interface connector provides a path for a test signal from the circuit module to the test circuit board.
A micro-backplane module, comprising:
- a first set of connectors configured to be attachably coupled to a circuit module, wherein the circuit module is a memory module that includes a solid state memory;
- and
- a second set of connectors configured to be attachably coupled to a micro-backplane module interface connector, wherein a respective connector of the second set of connectors is coupled to a respective connector of the first set of connectors,
- wherein the micro-backplane module is configured to enable a high speed signal to travel from the circuit module to the first set of connectors and the second set of connectors.
A method, comprising:
- providing a test circuit board configured to interface with a host system;
- providing a standard connector on the test circuit board;
- providing a micro-backplane module interface connector on the test circuit board;
- electrically coupling a micro-backplane module to the micro-backplane module interface connector;
- electrically coupling the micro-backplane module to a circuit module, wherein the circuit module includes a solid state device (SSD);
- and
- electrically coupling the circuit module to the standard connector.
An apparatus for testing a circuit module, comprising:
- a test circuit board comprising:
- a standard connector that includes at least one power pin;
- and
- a micro-backplane module interface connector configured to provide a path for a test signal from a circuit module, wherein the circuit module includes a solid state device (SSD);
- means for electrically coupling a micro-backplane module to the micro-backplane module interface connector;
- means for electrically coupling the micro-backplane module to the circuit module;
- and
- means for electrically coupling the circuit module to the standard connector.
Dependencies are inferred from the claim text.