System and method for inspecting surface flushness
AssigneeLockheed Martin Corporation
InventorsMichael J. Delaune, William B. Buchanan
Life of this patent
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AssigneeLockheed Martin Corporation
InventorsMichael J. Delaune, William B. Buchanan
Estimating the term…
A system includes one or more memory devices operable to store surface profile data and a processor operable to execute logic. The processor accesses the surface profile data for a first surface of a first component and a second surface of a second component, and determines, based at least in part on the surface profile data for the first and second surfaces, a best-fit between the first and second surfaces. The processor determines a first distance from a first edge-of-part point on the first surface to the best-fit, and a second distance from a second edge-of-part point on the second surface to the best-fit. The processor determines a flushness between the first surface and the second surface based at least in part on the first and second distances.
A method performed in a measurement device for determining surface flushness, comprising:
One or more computer-readable non-transitory storage media embodying software that is operable when executed by one or more processors of a measurement device for determining surface flushness to:
A system, comprising:
Dependencies are inferred from the claim text.