Methods for optimized production of multilayer metal/transparent conducting oxide (TCO) constructs
AssigneeMaterion Corporation
InventorsKevin V. Goodwin, Robert R. Newton, Peter J. Asiello, Ian S. Tribick
Life of this patent
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Abstract
The present disclosure relates to processes and apparatuses for optimizing the single pass production of multilayer constructs including metal/transparent conducting oxide (TCO) multilayers. Articles created from such methods are also disclosed. In particular, multilayer constructs are used as an electrochemical test strip, such as a biosensor, and will be described with particular reference thereto.
Claims15
An electrochemical test strip comprising a multilayer construct including:
- a substrate layer having a top surface and a bottom surface,
- a metal conductor layer deposited onto the top surface of the substrate layer, and
- a protective layer deposited onto a top surface of the conductor layer, wherein the protective layer is a transparent conducting oxide;
- wherein a pattern is formed from the metal conductor layer;
- and
- wherein the protective layer has substantially continuous surfaces without any pattern formed therein.
A method of forming an electrochemical test strip having a multilayer construct, comprising:
- processing a surface of a substrate layer to obtain a processed substrate;
- depositing a metal conductor layer onto the processed substrate,
- forming a pattern in the metal conductor layer;
- and
- depositing a protective transparent conductive oxide layer onto the metal conductor layer, wherein the protective transparent conductive oxide layer has substantially continuous surfaces without any pattern formed therein.
A system comprising:
- an electrochemical test strip with
- (1) a substrate layer having a top surface and a bottom surface;
- (2) a metal conductor layer formed on the top surface of the substrate layer;
- and
- (3) a protective layer deposited on top of the conductor layer comprising a transparent conductive oxide;
- and
- a measuring device;
- wherein a pattern is formed from the metal conductor layer;
- and
- wherein the protective layer has substantially continuous surfaces without any pattern formed therein.
Dependencies are inferred from the claim text.