# US 10,371,752 B2 · Switch device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,371,752 B2 - Document ID: US10371752B2 - Status: Granted - Kind: B2 - Application number: 14/694,242 - Filed: 2015-04-23 - Published: 2016-10-27 - Granted: 2019-08-06 - Earliest claimed: 2015-04-23 - Assignees: Infineon Technologies Austria AG - Applicants: Infineon Technologies Austria AG - Inventors: Anton Mauder; Kay Krupka; Jens Barrenscheen - Web page: https://patentgrep.com/patent/US10371752B2 ## CPC - G01R 31/3277: {of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches} - G01R 31/2621: {for testing field effect transistors, i.e. FET's} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract According to an embodiment of a switch device, the switch device includes a first switch, a second switch and an evaluation circuit. The evaluation circuit is configured to evaluate a temporal behavior of a node between the first switch and the second switch to detect a possible fault condition of at least one of the first switch or the second switch. A corresponding fault detection method for a switch device having a first switch and a second switch is also provided. ## Claims ### Claim 1 A switch device, comprising: a first switch; a second switch; and an evaluation circuit configured to evaluate a temporal behavior of a node between the first switch and the second switch to detect a possible fault condition of at least one of the first switch or the second switch, wherein the temporal behavior of the node comprises an information indicative of a rate or speed of change of a voltage at the node, wherein the evaluation circuit comprises a measurement transistor, wherein a control terminal of the measurement transistor is coupled to the node. ### Claim 2 (depends on 1) The switch device of claim 1, further comprising a control circuit configured to, when the switch device is to be closed, first close the first switch and then close the second switch, and, when the switch device is to be opened, first open the second switch and then open the first switch. ### Claim 3 (depends on 2) The switch device of claim 2, wherein the evaluation circuit is configured to detect a possible fault condition of the first switch. ### Claim 4 (depends on 1) The switch device of claim 1, wherein the first switch comprises a semiconductor switch. ### Claim 5 (depends on 4) The switch device of claim 4, wherein the second switch comprises one of a semiconductor switch and a mechanical switch. ### Claim 6 (depends on 1) The switch device of claim 1, wherein the first switch comprises a mechanical switch, and wherein the second switch comprises a mechanical switch. ### Claim 7 (depends on 1) The switch device of claim 1, further comprising terminals configured to be coupled with a load between the first switch and the second switch. ### Claim 8 (depends on 1) The switch device of claim 1, wherein the evaluation circuit is configured to monitor the temporal behavior when starting from a state in which the first and second switches are closed, the first switch is then opened followed by an opening of the second switch. ### Claim 9 (depends on 1) The switch device of claim 1, further comprising a circuit path configured to selectively charge the node to a first voltage, wherein the evaluation circuit is configured to monitor a change of a voltage at the node from the first voltage to a second voltage. ### Claim 10 (depends on 9) The switch device of claim 9, wherein the path comprises a resistor having a higher resistance than a resistance of the first switch in a closed state. ### Claim 11 (depends on 1) The switch device of claim 1, further comprising a capacitance coupled between the node and a terminal of the first switch. ### Claim 12 (depends on 1) The switch device of claim 1, wherein a terminal of the transistor is coupled to a timer. ### Claim 13 A fault detection method for a switch device having a first switch and a second switch, the method comprising: Evaluating, by an evaluation circuit, a temporal behavior of a node between the first and second switches; and Determining, by the evaluation circuit, a possible fault condition of at least one of the first switch or the second switch based on the temporal behavior, placing the first and second switches in an open condition; closing the first switch; and pre-charging the node to a positive voltage, wherein the temporal behavior of the node comprises an information indicative of a rate or speed of change of a voltage at the node, and wherein evaluating the temporal behavior comprises evaluating if the voltage at the node drops sufficiently to a second voltage after closing the first switch. ### Claim 14 (depends on 13) The method of claim 13, further comprising opening the first switch followed by opening the second switch prior to evaluating the temporal behavior. ### Claim 15 (depends on 13) The method of claim 13, further comprising charging the node to a first voltage prior to evaluating the temporal behavior, wherein the evaluating comprises evaluating a change of the voltage at the node to a second voltage. ### Claim 16 (depends on 13) The method of claim 13, further comprising providing a load between the first switch and the second switch. ### Claim 17 (depends on 16) The method of claim 16, further comprising: coupling the load to a voltage supply by closing the first and second switches; and decoupling the load from the voltage supply by opening the first and second switches. ### Claim 18 (depends on 13) The method of claim 13, wherein evaluating the temporal behavior comprises controlling a timer to measure a time characteristic of a decay of the voltage at the node.