# US 10,371,735 B2 · Method and system for monitoring electrical isolation > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,371,735 B2 - Document ID: US10371735B2 - Status: Granted - Kind: B2 - Application number: 14/941,740 - Filed: 2015-11-16 - Published: 2017-05-18 - Granted: 2019-08-06 - Earliest claimed: 2015-11-16 - Assignees: Deere & Company - Applicants: Deere & Company - Inventors: Olsen A. Rodrigues; Neal D. Clements; Kent D. Wanner - Web page: https://patentgrep.com/patent/US10371735B2 ## CPC - G01R 27/025: {Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters} - G01R 31/52: Testing for short-circuits, leakage current or ground faults - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A first voltage sensor measures a primary voltage between a first terminal of a tested device and electrical ground when a first switch and a second switch are in various on states or off states. In a test state either the first switch or the second switch is in an on state and in reference state both the first switch and the second switch are in on states. An observed leakage resistance is estimated based on the measured primary and secondary voltages of the test state. A reference leakage resistance is based on the measured primary and secondary voltages of the reference state. A test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount. ## Claims ### Claim 1 A method for monitoring electrical isolation of a tested device by a test circuit, the method comprising: activating a first switch of a test circuit, a second switch of the test circuit, or both to provide an on state or an off state for each one of the switches for a plurality of time intervals; in a first state while the first switch is in the on state and the second switch is in the off state, during a separate time interval among the time intervals, measuring a primary voltage between a first terminal to electrical ground; in a second state while the second switch is the on state and the first switch is in the off state, during a discrete time interval of the time intervals, measuring a secondary voltage between a second terminal to the electrical ground; in a third state while the first switch and the second switch are in on states, during a compound time interval of the time intervals, measuring the primary voltage and the secondary voltage; estimating an observed leakage resistance based on the measured primary voltages and secondary voltages of the first state and the second state; estimating a reference leakage resistance based on the measured primary voltages and the measured secondary voltages of the third state; and determining that the test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount, where the observed leakage resistance is based on voltage measurements during the separate and distinct time intervals and where the reference leakage resistance is based on voltage measurements during at least the compound time interval that does not temporally overlap with the separate and distinct time intervals. ### Claim 2 (depends on 1) The method according to claim 1 wherein estimating an observed leakage resistance comprises: measuring the secondary voltage in the first state during the separate time interval; measuring the primary voltage in the second state during the discrete time interval; and estimating an observed first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval. ### Claim 3 (depends on 2) The method according to claim 2 wherein estimating a reference leakage resistance comprises: estimating a reference first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the second state during the discrete time interval. ### Claim 4 (depends on 3) The method according to claim 3 wherein determining that the test circuit has failed comprises: determining that the test circuit has failed if the observed first leakage resistance differs from the reference first leakage resistance by more than a threshold amount. ### Claim 5 (depends on 1) The method according to claim 1 wherein estimating an observed leakage resistance comprises: measuring the secondary voltage in the first state during the separate time interval; measuring the primary voltage in the second state during the discrete time interval; and estimating an observed second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval. ### Claim 6 (depends on 5) The method according to claim 5 wherein estimating a reference leakage resistance comprises: estimating a reference second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the second state during the discrete time interval. ### Claim 7 (depends on 6) The method according to claim 6 wherein determining that the test circuit has failed comprises: determining that the test circuit has failed if the observed second leakage resistance differs from the reference second leakage resistance by more than a threshold amount. ### Claim 8 (depends on 1) The method according to claim 1 wherein the separate time interval, the discrete time interval, and the compound interval occur in any order or permutation with respect to each other. ### Claim 9 (depends on 1) The method according to claim 1 wherein the threshold amount is approximately fifty-percent of the reference leakage resistance. ### Claim 10 A method for monitoring electrical isolation of a tested device by a test circuit, the method comprising: activating a first switch of a test circuit, a second switch of the test circuit, or both to provide an on state or an off state for each one of the switches for a plurality of time intervals; in a first state while the first switch is in the on state and the second switch is in the off state, during a separate time interval among the time intervals, measuring a primary voltage between a first terminal to electrical ground; in a second state while the second switch is the on state and the first switch is in the off state, during a discrete time interval of the time intervals, measuring a secondary voltage between a second terminal to the electrical ground; in a third state while the first switch and the second switch are in on states, during a compound time interval of the time intervals, measuring the primary voltage and the secondary voltage; in a fourth state while the first switch and the second switch are in off states, during a supplemental time interval of the time intervals, measuring the primary voltage and the secondary voltage; estimating an observed leakage resistance based on the measured primary voltages and secondary voltages of the first state and the second state; estimating a reference leakage resistance based on the measured primary voltages and secondary voltages of the third state; and determining that the test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount, where the observed leakage resistance is based on voltage measurements during the separate and distinct time intervals and where the reference leakage resistance is based on voltage measurements during at least the compound time interval that does not temporally overlap with the separate and distinct time intervals. ### Claim 11 (depends on 10) The method according to claim 10 wherein estimating an observed leakage resistance comprises: measuring the secondary voltage in the first state during the separate time interval; and measuring the primary voltage in the second state during the discrete time interval; estimating an observed first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval. ### Claim 12 (depends on 11) The method according to claim 11 wherein estimating a reference leakage resistance comprises: estimating a reference first leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the fourth state during the supplemental time interval. ### Claim 13 (depends on 12) The method according to claim 12 wherein determining that the test circuit has failed comprises: determining that the test circuit has failed if the observed first leakage resistance differs from the reference first leakage resistance by more than a threshold amount. ### Claim 14 (depends on 10) The method according to claim 10 wherein estimating an observed leakage resistance comprises: measuring the secondary voltages in the first state during the separate time interval; measuring the primary voltages in the second state during the discrete time interval; and estimating an observed second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the first state during the separate time interval and in the second state during the discrete time interval. ### Claim 15 (depends on 14) The method according to claim 14 wherein estimating a reference leakage resistance comprises: estimating a reference second leakage resistance between the second terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the fourth state during the supplemental time interval. ### Claim 16 (depends on 15) The method according to claim 15 wherein determining that the test circuit has failed comprises: determining that the test circuit has failed if the observed second leakage resistance differs from the reference second leakage resistance by more than a threshold amount. ### Claim 17 (depends on 10) The method according to claim 10 wherein the separate time interval, the discrete time interval, and the compound time intervals occur in any order or permutation with respect to each other. ### Claim 18 (depends on 10) The method according to claim 10 wherein the threshold amount is approximately fifty-percent of the reference leakage resistance. ### Claim 19 A system for monitoring electrical isolation of a tested device by a test circuit, the method comprising: a first switch with its switched terminals coupled to electrical ground and a first resistor; a second switch with its switched terminals coupled to electrical ground a second resistor; a test driver for activating the first switch of a test circuit, the second switch of the test circuit, or both to provide an on state or an off state for each one of the switches for a plurality of time intervals in accordance with a first state, a second state, and a third state, where in a first state the first switch is in the on state and the second switch is in the off state, in the second state the second switch is the on state and the first switch is in the off state, in the third state the first switch is in the on state and the second switch is in the on state; a first voltage sensor for measuring a primary voltage between a first terminal to electrical ground during the first state, the second state and the third state; a second voltage sensor for measuring a secondary voltage between a second terminal to the electrical ground during the first state, the second state and third state; an electronic data processor adapted to: estimate an observed leakage resistance based on the measured primary voltages and secondary voltages of the first state and the second state; estimate a reference leakage resistance based on the measured primary voltages and the measured secondary voltages of the third state; and determine that the test circuit has failed if the observed leakage resistance differs from the reference leakage resistance by more than a threshold amount, where the observed leakage resistance is based on voltage measurements during different time intervals, among the time intervals, that are separate, distinct and do not overlap temporally. ### Claim 20 (depends on 19) The system according to claim 19 wherein the threshold amount is approximately fifty-percent of the reference leakage resistance. ### Claim 21 (depends on 19) The system according to claim 19 further comprising: the first voltage sensor and the second voltage sensor adapted to measure the primary voltage and the secondary voltage in a fourth state in which the first switch and the second switch are in off states; the data processor adapted to estimate a reference leakage resistance between the first terminal and the electrical ground based on the measured primary voltages and measured secondary voltages in the third state during the compound time interval and in the fourth state during a supplemental time interval.