# US 10,371,510 B2 · Structure status determination device, status determination system, and status determination method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,371,510 B2 - Document ID: US10371510B2 - Status: Granted - Kind: B2 - Application number: 15/556,369 - Filed: 2016-03-14 - Published: 2018-04-19 - Granted: 2019-08-06 - Earliest claimed: 2015-03-20 - Assignees: NEC Corporation - Applicants: NEC Corporation - Inventors: Hiroshi Imai - Web page: https://patentgrep.com/patent/US10371510B2 ## CPC - G01B 11/30: for measuring roughness or irregularity of surfaces - G01B 11/03: by measuring coordinates of points - G01B 11/16: for measuring the deformation in a solid, e.g. optical strain gauge - G01M 5/0033: {by determining damage, crack or wear} - G01M 5/0041: {by determining deflection or stress} - G01M 5/0091: {by using electromagnetic excitation or detection} - G01N 21/88: Investigating the presence of flaws or contamination - G01N 21/892: characterised by the flaw, defect or object feature examined - G01N 21/93: Detection standards; Calibrating {baseline adjustment, drift correction} - G01N 21/9515: {Objects of complex shape, e.g. examined with use of a surface follower device (measuring contours and curvatures G01B11/24)} - G06T 7/001: {using an image reference approach} - G06T 7/32: using correlation-based methods - G01N 2021/8887: {based on image processing techniques} - G06T 2207/10016: Video; Image sequence - G06T 2207/20021: Dividing image into blocks, subimages or windows - G06T 2207/20212: Image combination - G06T 2207/20228: Disparity calculation for image-based rendering - G06T 2207/30132: Masonry; Concrete - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract The purpose of the present invention is to accurately detect, from a remote location without contact, a structure's defects such as cracking, separation, and internal cavities by distinguishing therebetween. The status determination device includes: a displacement calculation unit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images; a depth moving amount calculation unit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; a displacement separation unit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and an abnormality determination unit that identifies a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount. ## Claims ### Claim 1 A status determination device comprising: a displacement calculation circuit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images; a depth moving amount calculation circuit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; a displacement separation circuit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and an abnormality determination circuit that identifies a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount. ### Claim 2 (depends on 1) The status determination device according to claim 1, wherein the depth moving amount calculation circuit estimates a tilt angle of the structure from the time-series images, and calculates the moving amount corrected using the tilt angle. ### Claim 3 (depends on 1) The status determination device according to claim 1, comprising: a differential displacement calculation circuit that calculates a two-dimensional differential spatial distribution from the two-dimensional spatial distribution of the displacement of the structure surface, wherein the abnormality determination circuit identifies a defect of the structure, based on comparison between the two-dimensional differential spatial distribution and a differential spatial distribution of a differential displacement having been prepared in advance. ### Claim 4 (depends on 1) The status determination device according to claim 1, wherein the abnormality determination circuit identifies a defect of the structure, based on a temporal change of the two-dimensional spatial distribution of the displacement of the structure surface. ### Claim 5 (depends on 3) The status determination device according to claim 3, wherein the abnormality determination circuit identifies a defect of the structure, based on a temporal change of the two-dimensional differential spatial distribution. ### Claim 6 (depends on 1) The status determination device according to claim 1, comprising: an abnormality map creation circuit that creates an abnormality map that represents a location and a type of the defect, based on a determination result of the abnormality determination circuit. ### Claim 7 (depends on 1) A status determination system comprising: a status determination device according to claim 1; and an image-capture device that captures the time-series images and provides the status determination device with the time-series images. ### Claim 8 A status determination method comprising: calculating, from time-series images of a structure surface before and after loading application, a two-dimensional spatial distribution of a displacement of the time-series images; calculating a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; calculating a correction amount based on the moving amount; separating a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and identifying a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount. ### Claim 9 A status determination device comprising: a displacement calculation circuit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images; a depth moving amount calculation circuit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; a displacement separation circuit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and an abnormality determination circuit that identifies a defect of the structure, based on comparison between the moving amount and a threshold value for the moving amount having been prepared in advance.