Semiconductor device, battery monitoring system, and diagnostic method for semiconductor device
AssigneeLapis Semiconductor Co., Ltd.
InventorsMasaru Sekiguchi, Hidekazu Kikuchi, Naoaki Sugimura
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AssigneeLapis Semiconductor Co., Ltd.
InventorsMasaru Sekiguchi, Hidekazu Kikuchi, Naoaki Sugimura
Estimating the term…
A semiconductor device for measuring a voltage of a battery cell, including first and second nodes, and first and second battery voltage measurement units. The first node is configured to receive a first voltage, the first voltage being a voltage of a capacitor that accumulates an electric charge based on the voltage of the battery cell. The first battery voltage measurement unit measures the first voltage through a first path. The second node is configured to receive a second voltage based on the voltage of the battery cell, the second node being different from the first node. The second battery voltage measurement unit measures the second voltage through a second path that is different from the first path.
A semiconductor device for measuring a voltage of a battery cell, comprising:
A semiconductor device for measuring a voltage of a battery cell, comprising:
A method for diagnosing an anomaly in a semiconductor device, the semiconductor device monitoring a voltage of a battery cell, the method comprising:
Dependencies are inferred from the claim text.