Test element analysis system for the analytical examination of a sample

A test element analysis system for the analytical examination of a sample, comprising a measurement device, the measurement device comprising a test element receptacle for receiving at least one test element at least partially, wherein the test element receptacle comprises at least one first part and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one alignment pin for engagement with at least one alignment hole of the test element, wherein the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, wherein the test element receptacle is configured to position the second part in at least three distinct positions relative to the first part, the at least three distinct positions comprising an intermediate position for inserting the test element into the test element receptacle, a closed position for performing a measurement and an open position for removing the test element from the test element receptacle,

• wherein in the closed position the alignment pin protrudes through the alignment hole,
• wherein in the open position the first part and the second part are spaced apart such that the test element may freely be removed from the test element receptacle, and
• wherein in the intermediate position the first part and the second part are spaced apart such that the test element may be inserted into the test element receptacle, whereas the alignment pin is positioned such that the test element is resiliently deformed by the alignment pin during the insertion, until the alignment pin snaps into the alignment hole.