Monitoring system
AssigneeImpedimed Limited
InventorsScott Chetham, Andrew William Ward, James McFarlane Kennedy
Life of this patent
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AssigneeImpedimed Limited
InventorsScott Chetham, Andrew William Ward, James McFarlane Kennedy
Estimating the term…
Apparatus for performing impedance measurements on a subject. The apparatus includes a first processing system for determining an impedance measurement procedure and determining instructions corresponding to the measurement procedure. A second processing system is provided for receiving the instructions, using the instructions to generate control signals, with the control signals being used to apply one or more signals to the subject. The second processing system then receives first data indicative of the one or more signals applied to the subject, second data indicative of one or more signals measured across the subject and performs at least preliminary processing of the first and second data to thereby allow impedance values to be determined.
A system for performing impedance measurements on a subject, the system comprising:
An apparatus for performing impedance measurements on a subject, the apparatus including:
A system for performing impedance measurements on a subject, the system including:
A system for performing impedance measurements on a subject, the system comprising:
A system for performing impedance measurements on a subject, the system comprising:
A system for performing impedance measurements on a subject, the system comprising:
A system for performing impedance measurements on a subject, the system comprising:
Dependencies are inferred from the claim text.