# US 10,320,185 B2 · Integrated circuit with protection from transient electrical stress events and method therefor > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,320,185 B2 - Document ID: US10320185B2 - Status: Granted - Kind: B2 - Application number: 15/273,223 - Filed: 2016-09-22 - Published: 2018-03-22 - Granted: 2019-06-11 - Earliest claimed: 2016-09-22 - Assignees: NXP USA, Inc. - Applicants: Freescale Semiconductor, Inc. - Inventors: Robert Matthew Mertens; Alexander Paul Gerdemann; Michael A. Stockinger - Web page: https://patentgrep.com/patent/US10320185B2 ## CPC - H02H 9/046: {responsive to excess voltage appearing at terminals of integrated circuits} - H03K 17/08122: {in field-effect transistor switches} - H10D 89/819: {Bias arrangements for gate electrodes of FETs, e.g. RC networks or voltage partitioning circuits (FETs in a Darlington configuration H10D89/817)} - H02H: EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS (indicating or signalling undesired working conditions G01R, e.g. G01R31/00, G08B; locating faults along lines G01R31/08; emergency protective devices H01H) - H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M) - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES ## Abstract An integrated circuit for protecting against transient electrical stress events includes a rail clamp device, and a trigger circuit including a resistive-capacitive (RC) filter, a drive circuit including a first inverter stage receiving an input signal from the RC filter, the drive circuit is configured to enable the rail clamp device during a transient electrical stress event, and a stress event detection circuit coupled to the RC filter. The drive circuit includes a configurable activation voltage which is controlled by the stress event detection circuit, wherein the activation voltage is reduced when the transient electrical stress event is detected. ## Claims ### Claim 1 An integrated circuit for protecting against transient electrical stress events comprising: a rail clamp device; a trigger circuit including: a resistive-capacitive (RC) filter; a drive circuit including a first inverter stage configured to receive an input signal from the RC filter, and to enable the rail clamp device during a transient electrical stress event; a stress event detection circuit coupled to the RC filter; the drive circuit having a configurable activation voltage which is controlled by the stress event detection circuit, wherein the activation voltage is reduced when the transient electrical stress event is detected; and an activation voltage adjustment circuit configured to generate an adjustment voltage to reduce the activation voltage when the transient electrical stress event is detected, wherein the activation voltage adjustment circuit includes: a first MOS transistor having a gate electrode coupled to a first output of the stress event detection circuit, a first current electrode coupled to a gate electrode of a second MOS transistor, and a second current electrode coupled to a first voltage supply net; the second MOS transistor further includes a first current electrode coupled to a second voltage supply and a second current electrode coupled to a first terminal of a ballast element in the drive circuit; a third MOS transistor having a gate electrode coupled to a second output of the stress event detection circuit, a first current electrode coupled to the gate electrode of the second MOS transistor, and a second current electrode coupled to the first terminal of the ballast element in the drive circuit. ### Claim 2 (depends on 1) The integrated circuit of claim 1 wherein the stress event detection circuit includes a first inverter cascaded with a second inverter, wherein an input to the first inverter is coupled between a resistor and a capacitor coupled in series in the RC filter, and an output of the second inverter is a detection signal that is provided to the first inverter stage of the drive circuit controlling the activation voltage. ### Claim 3 (depends on 2) The integrated circuit of claim 2 wherein the drive circuit includes a second inverter stage in cascade with the first inverter stage of the drive circuit, further wherein the first inverter stage of the drive circuit includes a control input coupled to the output of the second inverter of the stress event detection circuit, and the second inverter stage of the drive circuit includes an output coupled to operate the rail clamp device. ### Claim 4 (depends on 1) The integrated circuit of claim 1 wherein the first inverter stage of the drive circuit comprises: a first MOS transistor with a gate electrode receiving an input signal from the RC filter, a first current electrode coupled to a first voltage supply, and a second current electrode coupled to an output of the first inverter stage of the drive circuit; a ballast element with a first terminal coupled to the second current electrode of the first MOS transistor and a second terminal; an activation voltage adjustment circuit having a second MOS transistor that is configured to insert an adjustment voltage between a second voltage supply and the second terminal of the ballast element when the transient electrical stress event is detected; the first MOS transistor is of a first polarity type and the second MOS transistor is of a second polarity type. ### Claim 5 (depends on 4) The integrated circuit of claim 4, wherein the second MOS transistor has a first current electrode coupled to the second voltage supply, a second current electrode coupled to the second terminal of the ballast element, and a gate electrode; the stress event detection circuit switches the gate electrode of the second MOS transistor onto its second current electrode when the transient electrical stress event is detected. ### Claim 6 A method for protecting against transient electrical stress events comprising: using a detection circuit, detecting an over-voltage condition at a supply voltage coupled to a trigger circuit that includes a drive circuit, wherein the drive circuit is coupled to operate a rail clamp device; upon detecting the overvoltage condition, lowering an activation voltage of the drive circuit during the over-voltage condition with an activation voltage adjustment circuit which includes: a first MOS transistor having a gate electrode coupled to a first output of the detection circuit, a first current electrode coupled to a gate electrode of a second MOS transistor, and a second current electrode coupled to a first voltage supply net; the second MOS transistor further includes a first current electrode coupled to a second voltage supply and a second current electrode coupled to a first terminal of a ballast element in the drive circuit; a third MOS transistor having a gate electrode coupled to a second output of the detection circuit, a first current electrode coupled to the gate electrode of the second MOS transistor, and a second current electrode coupled to the first terminal of the ballast element in the drive circuit. ### Claim 7 (depends on 6) The method of claim 6 further comprising: detecting voltage at a gate of a transistor in the drive circuit to detect the over-voltage condition. ### Claim 8 (depends on 6) The method of claim 6 further comprising: temporarily lowering the activation voltage of the drive circuit by placing a MOS transistor in conducting mode during the over-voltage condition, wherein the MOS transistor is coupled between a voltage supply and the drive circuit. ### Claim 9 (depends on 6) The method of claim 6 further comprising: temporarily lowering the activation voltage of the drive circuit during the over-voltage condition by adding a biasing voltage at a gate electrode of a transistor in the drive circuit. ### Claim 10 (depends on 9) The method of claim 9 wherein the gate electrode of the transistor in the drive circuit is coupled to a terminal of a capacitive element. ### Claim 11 (depends on 7) The method of claim 7 further comprising: feeding back the input to the drive circuit to a resistive-capacitive filter. ### Claim 12 (depends on 6) The method of claim 6 wherein: lowering charge stored by a first capacitive element in a RC filter during operation using a second capacitive element.