# US 10,320,131 B2 · Recessed switched test connector > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,320,131 B2 - Document ID: US10320131B2 - Status: Granted - Kind: B2 - Application number: 15/628,427 - Filed: 2017-06-20 - Published: 2018-12-20 - Granted: 2019-06-11 - Earliest claimed: 2017-06-20 - Assignees: Microsoft Technology Licensing, LLC - Applicants: Microsoft Technology Licensing, LLC - Inventors: Chen Zhang; Toby Morris - Web page: https://patentgrep.com/patent/US10320131B2 ## CPC - H01R 24/50: mounted on a PCB [Printed Circuit Board] - H01R 13/703: operated by engagement or disengagement of coupling parts, {e.g. dual-continuity coupling part}(H01R13/71 takes precedence) - H01R 13/7031: {Shorting, shunting or bussing of different terminals interrupted or effected on engagement of coupling part, e.g. for ESD protection, line continuity} - H01R 13/74: Means for mounting coupling parts in openings of a panel - H01R 24/44: comprising impedance matching means - H01R 2201/20: for testing or measuring purposes - H01R: ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS ## Abstract Circuit boards incorporating one or more wireless communication components are often subjected to certification testing during commissioning. A test port is often included within each circuit board to perform the certification testing. The presently disclosed recessed test connectors reduce or eliminate protrusion of the test port on a non-component side of the circuit board, while still providing access to the test port from the non-component side of the circuit board. ## Claims ### Claim 1 A printed circuit board comprising: a substrate including an aperture; an array of components attached to a first side of the substrate; and a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes: a test port accessible from a second side of the substrate; a bracket securing the recessed switched test connector within the aperture; and a contact to elastically deflect and electrically open an electrical path through the printed circuit board when an associated test probe is inserted into the test port. ### Claim 2 (depends on 1) The printed circuit board of claim 1, wherein the recessed switched test connector protrudes beyond the first side of the substrate. ### Claim 3 (depends on 2) The printed circuit board of claim 2, wherein the array of components protrudes beyond the first side of the substrate a magnitude greater than the recessed switched test connector protrudes beyond the first side of the substrate. ### Claim 4 (depends on 1) The printed circuit board of claim 1, wherein the recessed switched test connector is set back within the aperture on the second side of the substrate. ### Claim 5 (depends on 1) The printed circuit board of claim 1, wherein the electrical path through the printed circuit board is restored when the associated test probe is removed from the test port. ### Claim 6 (depends on 1) The printed circuit board of claim 1, wherein the test port includes a self-centering countersink for the test probe. ### Claim 7 (depends on 1) The printed circuit board of claim 1, wherein the second side of the substrate opposes the first side of the substrate. ### Claim 8 (depends on 1) The printed circuit board of claim 1, wherein the bracket serves as electrical ground for the recessed switched test connector. ### Claim 9 (depends on 1) The printed circuit board of claim 1, wherein the bracket is attached to the second side of the substrate. ### Claim 10 (depends on 1) The printed circuit board of claim 1, wherein the recessed switched test connector further comprises: a bottom plate crimped to the bracket, wherein the electrical path through the recessed switched test connector is compressively secured between the bottom plate and the bracket. ### Claim 11 A method of using a recessed switched test connector in a printed circuit board comprising: inserting a test probe into a test port of the recessed switched test connector, the recessed switched test connector oriented within an aperture in a substrate, and the recessed switched test connector accessible from a side of the substrate opposite an array of components attached to the substrate, whereby a contact elastically deflects and electrically opens when the test probe is inserted into the test port; and certification testing an electrical circuit connected from the recessed switched test connector to the test probe. ### Claim 12 (depends on 11) The method of claim 11, further comprising: removing the test probe from the test port of the recessed switched test connector following the certification testing of the electrical circuit. ### Claim 13 (depends on 12) The method of claim 12, wherein removing the test probe from the test port restores the electrical path through the printed circuit board and disconnects the test probe from the electrical circuit. ### Claim 14 (depends on 11) The method of claim 11, wherein inserting the test probe into the test port connects the test probe to the electrical circuit. ### Claim 15 (depends on 11) The method of claim 11, wherein the recessed switched test connector is recessed within the aperture on the side of the substrate opposite the array of printed circuit board components attached to the substrate. ### Claim 16 (depends on 11) The method of claim 11, wherein inserting the test probe into the test port further includes directly grounding the test probe to the recessed switched test connector. ### Claim 17 A computing device comprising: a printed circuit board including: a substrate including an aperture; an array of components attached to a first side of the substrate; a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes: a test port accessible from a second side of the substrate; and a bracket securing the recessed switched test connector within the aperture; a display residing in close proximity to the first side of the substrate; and a case residing in close proximity to the second side of the substrate, wherein the case includes a test aperture axially aligned with the test port permitting access to the test port from outside the computing device. ### Claim 18 (depends on 17) The computing device of claim 17, further comprising: a test probe for selective insertion into the test port, wherein the test probe is connected to a coaxial cable, and wherein an impedance of the test probe substantially matches an impedance of the coaxial cable. ### Claim 19 (depends on 17) The computing device of claim 17, further comprising: a test probe for selective insertion into the test port, wherein the test probe is grounded directly to the recessed switched test connector when inserted into the test port.