Langmuir probe
AssigneeUkniversitetet | Olso
InventorsArne Pedersen, Tore André Bekkeng, Espen Trondsen, Jøran Moen
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Abstract
A method of determining payload potential may include the steps of receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe, receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe, assigning a value for the electron temperature in which the multi-needle Langmuir probe was operating, and using the current and voltage data, the assigned electron temperature value and Langmuir probe theory to calculate the platform potential of the multi-needle Langmuir probe.
Claims14
A method of determining a platform potential, the method comprising:
- receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe;
- receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe;
- assigning a value for an electron temperature in which the multi-needle Langmuir probe was operating;
- and
- using the resulting first collected current data, the resulting second collected current data, the first bias voltage data, the second bias voltage data, and the value for the electron temperature to calculate the platform potential of the multi-needle Langmuir probe.
A device for determining a platform potential, the device comprising:
- a multi-needle Langmuir Probe;
- and
- a processor,
- wherein the processor is arranged to receive data on a first bias voltage and a resulting first collected current of a first needle of the multi-needle Langmuir probe;
- receive data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe;
- assign a value for an electron temperature in which the multi-needle Langmuir probe is operating;
- and use the resulting first collected current data, the resulting second collected current data, the first bias voltage data, the second bias voltage data, and the value for the electron temperature to calculate the platform potential of the multi-needle Langmuir probe.
Dependencies are inferred from the claim text.