# US 10,313,032 B2 · Test system and method for testing a device under test > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,313,032 B2 - Document ID: US10313032B2 - Status: Granted - Kind: B2 - Application number: 15/787,231 - Filed: 2017-10-18 - Published: 2018-04-19 - Granted: 2019-06-04 - Earliest claimed: 2016-10-19 - Assignees: Rohde & Schwarz GmbH & Co. KG - Applicants: Rohde & Schwarz GmbH & Co. KG - Inventors: Corbett Rowell; Hendrik Bartko; Adam Tankielun - Web page: https://patentgrep.com/patent/US10313032B2 ## CPC - H04B 17/12: of transmit antennas, e.g. of the amplitude or phase - G01R 29/08: Measuring electromagnetic field characteristics - G01R 29/10: Radiation diagrams of antennas - H01Q 1/08: Means for collapsing antennas or parts thereof (collapsible loop antennas H01Q7/02; means for collapsing H-antennas or Yagi antennas H01Q19/04) - H01Q 3/267: {Phased-array testing or checking devices} - H01Q 3/2676: {Optically controlled phased array} - H01Q 19/065: {Zone plate type antennas} - H04B 5/73: for taking measurements, e.g. using sensing coils - H04B: TRANSMISSION - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H01Q: ANTENNAS, i.e. RADIO AERIALS (radiators or antennas for microwave heating H05B6/72) ## Abstract A test system for testing a device under test is described, which comprises an antenna array having a plurality of antenna elements and an adjustment unit having a Fresnel structure. The adjustment unit is placed between the antenna array and the device under test. Further, a method for testing a device under test is described. ## Claims ### Claim 1 A test system for testing a device under test, comprising: an antenna array having a plurality of antenna elements; an adjustment unit having a Fresnel structure, said adjustment unit being placed between said antenna array and said device under test, said antenna array being a plane wave converter, said adjustment unit being placed in a near field of said antenna array; and a control unit connected with said adjustment unit for controlling said adjustment unit, the control unit controlling the position of the adjustment unit with respect to at least one of the antenna array and the device under test such that different field distributions are projected by the adjustment unit. ### Claim 2 (depends on 1) The test system according to claim 1, wherein said adjustment unit is separately formed with respect to said antenna array. ### Claim 3 (depends on 1) The test system according to claim 1, wherein said test system is configured to generate plane waves in the near field of said antenna array. ### Claim 4 (depends on 1) The test system according to claim 1, wherein said adjustment unit is configured to project different field distributions. ### Claim 5 (depends on 1) The test system according to claim 1, wherein said adjustment unit comprises a plate having at least a semi-periodic arrangement of slots or patches. ### Claim 6 (depends on 5) The test system according to claim 5, wherein said plate has a periodic arrangement of slots or patches. ### Claim 7 (depends on 5) The test system according to claim 5, wherein said plate is made of metal. ### Claim 8 (depends on 1) The test system according to claim 1, wherein a position of said adjustment unit is determined with Fourier transforms. ### Claim 9 (depends on 1) The test system according to claim 1, wherein said adjustment unit is an optical unit. ### Claim 10 (depends on 1) The test system according to claim 1, wherein said adjustment unit is configured to be at least partly a lens. ### Claim 11 (depends on 1) The test system according to claim 1, wherein said adjustment unit is configured to be at least partly a reflector. ### Claim 12 A method for testing a device under test, with the following steps: providing an antenna array having a plurality of antenna elements, the antenna array being a plane wave converter; providing a device under test; providing an adjustment unit having a Fresnel structure; placing said adjustment unit between said antenna array and said device under test; and measuring at least one of the receiving and transmission properties of the device under test under far field conditions at different frequencies. ### Claim 13 A test system for testing a device under test, comprising: an antenna array having a plurality of antenna elements, said antenna array being a plane wave converter; and an adjustment unit having a Fresnel structure, said adjustment unit being placed between said antenna array and said device under test, said adjustment unit being placed in the near field of said antenna array, wherein the test system is configured to measure at least one of the receiving and the transmission properties of the device under test under far field conditions at different frequencies. ### Claim 14 (depends on 13) The system according to claim 13, wherein the test system is configured to measure at least one of the receiving and the transmission properties of the device under test under far field conditions at different frequencies in the respective near field of at least one of the device under test and the antenna array. ### Claim 15 (depends on 1) The system according to claim 1, wherein the test system comprises a chamber, said antenna array and said device under test being positioned within said chamber.