# US 10,312,600 B2 · Free space segment tester (FSST) > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,312,600 B2 - Document ID: US10312600B2 - Status: Granted - Kind: B2 - Application number: 15/596,370 - Filed: 2017-05-16 - Published: 2017-11-23 - Granted: 2019-06-04 - Earliest claimed: 2016-05-20 - Assignees: Kymeta Corporation - Applicants: Tom Hower; Lamin Ceesay; Benjamin Ash; Matthew Fornes; William Pedler; Mohsen Sazegar; Jacob Tyler Repp - Inventors: Tom Hower; Lamin Ceesay; Benjamin Ash; Matthew Fornes; William Pedler; Mohsen Sazegar; Jacob Tyler Repp - Web page: https://patentgrep.com/patent/US10312600B2 ## CPC - H01Q 21/064: {using horn or slot aerials (slotted waveguides arrays H01Q21/005)} - H01Q 1/288: {Satellite antennas} - H01Q 3/24: varying the orientation by switching energy from one active radiating element to another, e.g. for beam switching - H01Q 3/267: {Phased-array testing or checking devices} - H01Q: ANTENNAS, i.e. RADIO AERIALS (radiators or antennas for microwave heating H05B6/72) ## Abstract Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment. In one example, the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable. ## Claims ### Claim 1 An apparatus comprising: a frame having a platform to support a thin film transistor (TFT) segment of a flat panel antenna; a first horn antenna to transmit microwave energy to the TFT segment and to receive reflected microwave energy from the TFT segment; a second horn antenna to receive microwave energy transmitted though the TFT segment; a controller coupled to the TFT segment and to provide at least one stimulus or condition to the TFT segment; and an analyzer to measure a characteristic of the TFT segment using the first horn antenna and second horn antenna. ### Claim 2 (depends on 1) The apparatus of claim 1, wherein the analyzer is to measure a characteristic including a microwave frequency response at the first horn antenna or the second horn antenna for the TFT segment. ### Claim 3 (depends on 2) The apparatus of claim 2, wherein the analyzer is to measure a microwave frequency response at the first horn antenna or the second horn antenna as a function of a command signal stimuli or without a command signal stimuli from the controller. ### Claim 4 (depends on 3) The apparatus of claim 3, wherein the analyzer is to measure a transmission response at the second horn antenna and a reflection response at the first horn antenna for the TFT segment. ### Claim 5 (depends on 4) The apparatus of claim 4, further comprising: a computer coupled to the controller and analyzer and to calibrate at least one of the microwave frequency response, transmission response, or reflection response for the TFT segment based on one or more stimuli. ### Claim 6 (depends on 5) The apparatus of claim 5, wherein the computer is to characterize the microwave frequency response, transmission response, or reflection response characteristics for the TFT segment. ### Claim 7 (depends on 1) The apparatus of claim 1, wherein the condition includes an environmental condition. ### Claim 8 (depends on 1) The apparatus of claim 1, wherein the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable. ### Claim 9 A method comprising: applying microwave energy to a thin film transistor (TFT) segment of a flat panel antenna; measuring at least one of the transmitted microwave energy transmitted through the TFT segment or the reflected microwave energy from the TFT segment; and calibrating the measured microwave energy. ### Claim 10 (depends on 9) The method of claim 9, further comprising measuring transmission or reflection coefficients for the TFT segment. ### Claim 11 (depends on 10) The method of claim 10, wherein the transmission or reflection coefficients are measured as a function of microwave energy frequency or a command signal to the TFT segment. ### Claim 12 (depends on 11) The method of claim 11, further comprising calibrating the transmission or reflection coefficients. ### Claim 13 (depends on 11) The method of claim 11, further comprising varying the command signal to the TFT segment and measuring the transmitted or reflected microwave energy after varying the command signal. ### Claim 14 (depends on 10) The method of claim 10, wherein the coefficients include phase and amplitude values. ### Claim 15 (depends on 9) The method of claim 9, further comprising measuring the microwave energy frequency response of the TFT segment using the transmitted or reflected microwave energy. ### Claim 16 (depends on 15) The method of claim 15, further comprising detecting if the TFT segment is acceptable based on the measured microwave energy response of the TFT segment. ### Claim 17 (depends on 16) The method of claim 16, using the TFT segment if determined to be acceptable for assembly into a flat panel antennal. ### Claim 18 (depends on 15) The method of claim 15, further comprising calibrating the measured microwave energy frequency response. ### Claim 19 An apparatus comprising: a frame having a platform to support a thin film transistor (TFT) segment of a flat panel antenna; a first horn antenna to transmit or receive microwave energy to and from the TFT segment; a controller coupled to the TFT segment and to provide at least one stimulus or condition to the TFT segment; and an analyzer to measure a characteristic of the TFT segment using the first horn antenna. ### Claim 20 (depends on 19) The apparatus of claim 19, further comprising: a second horn antenna to receive transmitted microwave energy through the TFT segment, wherein the analyzer is to measure a characteristic of the TFT segment using the second horn antenna.