# US 10,312,023 B2 · Multilayer ceramic capacitor and method for producing the same

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- Number: US 10,312,023 B2
- Document ID: US10312023B2
- Status: Granted
- Kind: B2
- Application number: 15/163,885
- Filed: 2016-05-25
- Published: 2016-12-08
- Granted: 2019-06-04
- Earliest claimed: 2015-06-05
- Assignees: Murata Manufacturing Co., Ltd.
- Applicants: Murata Manufacturing Co., Ltd.
- Inventors: Akitaka Doi; Shinichi Yamaguchi; Shoichiro Suzuki
- Web page: https://patentgrep.com/patent/US10312023B2

## CPC

- H01G 4/30: Stacked capacitors (H01G4/33 takes precedence)
- H01G 4/008: Selection of materials
- H01G 4/232: electrically connecting two or more layers of a stacked or rolled capacitor
- H01G: CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B3/00; capacitors having potential barriers H10D1/62, H10K10/10)

## Abstract

A multilayer ceramic capacitor having inner electrodes with a Ni-Metal A alloy, the Metal A being selected from Fe, V, Y, and Cu and dissolved in the Ni to form a solid solution. The percentage of the Metal A with respect to the total amount of Metal A and Ni in near-surface regions located at a depth of 2 nm from a surface of the inner electrode in contact with an adjacent ceramic dielectric layer is 1.4 or more atom %, and XA−YA≥1.0, where XA represents the atomic percentage of Metal A in the near-surface regions and YA represents the atomic percentage of Metal A in mid-thickness regions of the inner electrodes. A method for producing a multilayer ceramic capacitor includes annealing the ceramic multilayer body under specific conditions to thereby increase, in the inner electrodes, the percentage of Metal A in the near-surface regions.

## Claims

### Claim 1

A multilayer ceramic capacitor comprising:
a ceramic multilayer body including a stack of a plurality of ceramic dielectric layers and a plurality of inner electrodes arranged opposing each other with a respective ceramic dielectric layer of the plurality of ceramic dielectric layers interposed therebetween; and
outer electrodes disposed on an outer surface of the ceramic multilayer body, each outer electrode being in electrical connection with a respective set of inner electrode of the plurality inner electrodes,
the inner electrodes including a Ni-Metal A alloy, wherein Metal A is at least one metal selected from the group consisting of Fe, V, Y, and Cu,
a percentage of Metal A with respect to a total amount of Metal A and Ni in near-surface regions of the plurality of inner electrodes is 1.4 or more atom %, each of the near-surface regions being a region at a depth of within 2 nm from a surface in contact with an adjacent one of the respective ceramic dielectric layers, and
XA−YA≥1.0
where XA represents an atomic percentage of Metal A in the near-surface regions and YA represents an atomic percentage of Metal A in mid-thickness regions of the plurality of inner electrodes.

### Claim 2 (depends on 1)

The multilayer ceramic capacitor according to claim 1, wherein the plurality of inner electrodes have a thickness defined as T, and each of the mid-thickness regions is located 0.2T or more inward from each surface of the plurality of inner electrodes in a thickness direction thereof.

### Claim 3 (depends on 1)

The multilayer ceramic capacitor according to claim 1, wherein the Ni-Metal A alloy contains a solid solution of Ni and the Metal A.

### Claim 4 (depends on 1)

The multilayer ceramic capacitor according to claim 1, wherein the plurality of inner electrodes contain a co-material.

### Claim 5 (depends on 4)

The multilayer ceramic capacitor according to claim 4, wherein the co-material contains at least some constituent elements of a ceramic material of the ceramic dielectric layers.