# US 10,311,767 B2 · Display device and method of sensing characteristics of thin film transistors having different types of electrical characteristics > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,311,767 B2 - Document ID: US10311767B2 - Status: Granted - Kind: B2 - Application number: 15/821,359 - Filed: 2017-11-22 - Published: 2018-05-31 - Granted: 2019-06-04 - Earliest claimed: 2016-11-25 - Assignees: LG Display Co., Ltd. - Applicants: LG Display Co., Ltd. - Inventors: Sohee Choi; Namyong Gong; Sungsoo Shin - Web page: https://patentgrep.com/patent/US10311767B2 ## CPC - G09G 3/006: {Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309)} - G09G 3/3233: with pixel circuitry controlling the current through the light-emitting element - H10D 30/6745: {Polycrystalline or microcrystalline silicon} - H10D 86/421: {having a particular composition, shape or crystalline structure of the active layer} - H10D 86/423: {comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO} - H10D 86/60: wherein the TFTs are in active matrices - G09G 2300/0814: used for selection purposes, e.g. logical AND for partial update - G09G 2300/0819: used for counteracting undesired variations, e.g. feedback or autozeroing - G09G 2300/0842: forming a memory circuit, e.g. a dynamic memory with one capacitor - G09G 2300/0861: with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes - G09G 2310/08: Details of timing specific for flat panels, other than clock recovery - G09G 2320/0295: by monitoring each display pixel - G09G 2320/045: Compensation of drifts in the characteristics of light emitting or modulating elements - G09G 2330/10: Dealing with defective pixels - G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00) - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES ## Abstract A display device is disclosed. The display device includes subpixels including data lines, scan lines, and one or more thin film transistors (TFTs). The display device includes a second switching TFT configured to output a reference signal input through a drain node to a source node according to a second scan signal input through a gate node, a first switching TFT configured to have a drain node connected to the source node of the second switching TFT, and form a current path such that the reference signal input through the drain node is transmitted to the data line according to a first scan signal input to a gate node, and an integrated circuit (IC) unit configured to sense a voltage of a current transmitted to the data line through the first switching TFT and sense a threshold voltage of the first switching TFT based on the sensed voltage. ## Claims ### Claim 1 A display device comprising subpixels including a data line, a scan line, and a plurality of thin film transistors (TFTs), comprising: a second switching TFT having gate, source and drain nodes and outputting a reference signal input through the drain node to the source node according to a second scan signal input through the gate node; a first switching TFT having gate, source and drain nodes, the drain node of the first switching TFT directly connected to the source node of the second switching TFT, and the first switching TFT forming a current path such that the reference signal input through the drain node is transmitted to the data line connected to the source node of the first switching TFT according to a first scan signal input through the gate node; and an integrated circuit (IC) unit sensing a voltage of a current transmitted to the data line through the first switching TFT and sensing a threshold voltage of the first switching TFT based on the sensed voltage, wherein the reference signal, the first scan signal and the second scan signal are generated from the IC unit. ### Claim 2 (depends on 1) The display device of claim 1, wherein the IC unit includes a digital to analog converter (DAC) outputting a predetermined analog signal such that a load of the data line connected to the source of the first switching TFT is initialized when the first switching TFT is in an off state. ### Claim 3 (depends on 1) The display device of claim 1, wherein the IC unit includes an analog to digital converter (ADC) sensing a voltage of a current transmitted to the data line through the first switching TFT and outputting the sensed voltage as a digital signal. ### Claim 4 (depends on 3) The display device of claim 3, wherein the IC unit includes a sampling switch adjusting a timing of the outputting the digital signal. ### Claim 5 (depends on 1) The display device of claim 1, wherein the first switching TFT and the second switching TFT are formed of an N-type oxide TFT; and wherein at least one switching TFT for driving the subpixel is implemented as an N-type low temperature polysilicon (LTPS) TFT or a combination of an N-type LTPS TFT and a P-type LTPS TFT. ### Claim 6 A method of sensing element characteristics of a display device comprising subpixels including a data line, a scan line, a second switching TFT having gate, drain and source nodes, inputting a reference signal through the drain node and outputting the reference signal to the source node, and a first switching TFT having gate, drain and source nodes, the drain node connected to the source node of the second switching TFT, and the source node connected to the data line, the method comprising: applying a second scan signal to the second switching TFT to output the reference signal input through the drain node to the source node; applying a first scan signal to the first switching TFT to output the reference signal input through the drain node to the source node; and sensing a voltage of a current transmitted to the data line through the first switching TFT and sensing a threshold voltage of the first switching TFT based on the sensed voltage. ### Claim 7 (depends on 6) The method of claim 6, further comprising: applying the first scan signal to turn off the first switching TFT; and outputting a predetermined analog signal to the data line so that a load of the data line to which the first switching TFT is connected is initialized. ### Claim 8 (depends on 6) The method of claim 6, wherein the sensing a threshold voltage of the first switching TFT comprises: sensing a voltage of a current transmitted to the data line according to a predetermined period; and outputting the sensed voltage as a digital signal. ### Claim 9 (depends on 6) The method of claim 6, wherein the first switching TFT and the second switching TFT are formed of an N-type oxide TFT; and wherein at least one switching TFT for driving the subpixel is implemented as an N-type LTPS TFT or a combination of an N-type LTPS TFT and a P-type LTPS TFT. ### Claim 10 A display device comprising subpixels including a data line, a scan line, and a plurality of thin film transistors (TFTs), comprising: a second switching TFT having gate, drain and source nodes, outputting a reference signal input through the drain node to the source node according to a second scan signal input through the gate node; a first switching TFT having gate, drain and source nodes, the drain node of the first switching TFT directly connected to the source node of the second switching TFT, and forming a current path such that the reference signal input through the drain node is transmitted to the data line connected to the source node of the first switching TFT according to a first scan signal input through the gate node; and an IC unit, when a predetermined condition is satisfied, being switched to a diagnostic mode, sensing a voltage of a current transmitted to the data line through the first switching TFT, sensing a threshold voltage of the first switching TFT based on the sensed voltage, and reporting the sensed threshold voltage of the first switching TFT to a server of a customer service center, wherein the reference signal, the first scan signal and the second scan signal are generated from the IC unit. ### Claim 11 (depends on 10) The display device of claim 10, wherein the IC unit is configured to display a pixel determined to contain a defective TFT to be visually distinguished from other pixels as a graphical screen according to the sensed result of the threshold voltage of the first switching TFT and report the sensed threshold voltage of the first switching TFT. ### Claim 12 (depends on 10) The display device of claim 10, wherein the IC unit is configured to transmit the sensed result of the threshold voltage of the first switching TFT to a predetermined server through a network and report the sensed threshold voltage of the first switching TFT. ### Claim 13 (depends on 10) The display device of claim 10, wherein the first switching TFT and the second switching TFT are formed of an N-type oxide TFT; and wherein at least one switching TFT for driving the subpixel is implemented as an N-type LTPS TFT or a combination of an N-type LTPS TFT and a P-type LTPS TFT. ### Claim 14 (depends on 10) The display device of claim 10, wherein the predetermined condition is satisfied when a quality test is performed on the display device at a production site, a diagnostic function of the display device is selected, or the display device is entered a predetermined diagnostic mode. ### Claim 15 A display device comprising subpixels including a data line, a scan line, and a plurality of thin film transistors (TFTs), comprising: a second switching TFT having gate, drain and source nodes, outputting a reference signal input through the drain node to the source node according to a second scan signal input through the gate node; a first switching TFT having gate, drain and source nodes, the drain node of the first switching TFT directly connected to the source node of the second switching TFT, and forming a current path such that the reference signal input through the drain node is transmitted to the data line connected to the source node of the first switching TFT according to a first scan signal input through the gate node; and an IC unit sensing a voltage of a current transmitted to the data line through the first switching TFT, sensing a threshold voltage of the first switching TFT based on the sensed voltage, and reporting the sensed threshold voltage of the first switching TFT to a server of a customer service center when a quality test is performed on the display device at a production site, a diagnostic function of the display device is selected, or the display device is entered a predetermined diagnostic mode, wherein the reference signal, the first scan signal and the second scan signal are generated from the IC unit. ### Claim 16 (depends on 15) The display device of claim 15, wherein the IC unit displays a pixel determined to contain a defective TFT to be visually distinguished from other pixels as a graphical screen according to the sensed result of the threshold voltage of the first switching TFT and report the sensed threshold voltage of the first switching TFT. ### Claim 17 (depends on 15) The display device of claim 15, wherein the IC unit transmits the sensed result of the threshold voltage of the first switching TFT to a predetermined server through a network and report the sensed threshold voltage of the first switching TFT. ### Claim 18 (depends on 15) The display device of claim 15, wherein the first switching TFT and the second switching TFT are formed of an N-type oxide TFT, wherein at least one switching TFT for driving the subpixel is implemented as an N-type LTPS TFT or a combination of an N-type LTPS TFT and a P-type LTPS TFT. ### Claim 19 (depends on 15) The display device of claim 15, wherein the IC unit includes a digital to analog converter (DAC) outputting a predetermined analog signal such that a load of the data line connected to the source of the first switching TFT is initialized when the first switching TFT is in an off state. ### Claim 20 (depends on 15) The display device of claim 15, wherein the IC unit includes an analog to digital converter (ADC) sensing a voltage of a current transmitted to the data line through the first switching TFT and outputting the sensed voltage as a digital signal. ### Claim 21 (depends on 20) The display device of claim 20, wherein the IC unit includes a sampling switch adjusting a timing of the outputting the digital signal.