# US 10,311,765 B2 · Electrostatic discharge (ESD) and testing composite component, array substrate and display device

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- Number: US 10,311,765 B2
- Document ID: US10311765B2
- Status: Granted
- Kind: B2
- Application number: 15/538,392
- Filed: 2016-11-15
- Published: 2018-08-02
- Granted: 2019-06-04
- Earliest claimed: 2016-04-26
- Assignees: Boe Technology Group Co., Ltd.
- Applicants: Boe Technology Group Co., Ltd.
- Inventors: Xueguang Hao; Yong Qiao; Xinyin Wu
- Web page: https://patentgrep.com/patent/US10311765B2

## CPC

- G09G 3/006: {Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309)}
- G02F 1/1335: Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F 1/136: Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit (G02F1/135 takes precedence)
- G02F 1/136204: {Arrangements to prevent high voltage or static electricity failures}
- G09G 3/36: using liquid crystals
- H10D 30/67: Thin-film transistors [TFT] {(Stacked nanowire, nanosheet or nanoribbon FETs H10D30/501)}
- H10D 89/811: {using FETs as protective elements}
- G02F 1/1309: {Repairing; Testing}
- G02F 1/136286: {Wiring, e.g. gate line, drain line}
- G09G 3/3208: organic, e.g. using organic light-emitting diodes [OLED]
- G09G 2330/04: Display protection
- G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00)
- G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES

## Abstract

An electrostatic discharge (ESD) and testing composite component, an array substrate and a display device are provided. The composite component includes a first signal line, a first thin-film transistor (TFT) and a second TFT which are electrically connected with the first signal line, a second signal line electrically connected with the first TFT, and a third signal line and a fourth signal line which are electrically connected with the second TFT; and the composite component is configured to provide a testing signal for the first signal line at a first stage and configured to provide ESD for the first signal line at a second stage, and the first stage is a testing stage and the second stage is an ESD stage. The composite component occupies small area and acquire a narrow-bezel and/or high-resolution display panel.

## Claims

### Claim 1

An electrostatic discharge (ESD) and testing composite component, wherein the composite component comprises a first signal line, a first thin-film transistor (TFT) and a second TFT which are electrically connected with the first signal line, a second signal line electrically connected with the first TFT, and a third signal line and a fourth signal line which are electrically connected with the second TFT; and the composite component is configured to provide a testing signal for the first signal line at a first stage and configured to provide ESD for the first signal line at a second stage, and
the ESD and testing composite component further comprising a third TFT electrically connected with the first signal line and a fifth signal line electrically connected with the third TFT, wherein the second TFT, the third signal line and the fourth signal line are configured to provide a testing signal for the first signal line at the first stage, and the first TFT, the third TFT, the second signal line and the fifth signal line are configured to provide ESD for the first signal line at the second stage.

### Claim 2 (depends on 1)

The ESD and testing composite component according to claim 1, wherein at the first stage, the first TFT and the second TFT are configured to be switched on in a case that a first level or a second level signal is applied to the second signal line, the third signal line and the fourth signal line, and transmit the first level or second level signal applied to the second signal line and the third signal line to the first signal line for testing.

### Claim 3 (depends on 1)

The ESD and testing composite component according to claim 1, wherein at the second stage, the first TFT and the second signal line are configured to lead out static charges accumulated on the first signal line in a case that a first level signal is applied to the second signal line and a second level signal is applied to the third signal line and the fourth signal line; and the second TFT and the third signal line are configured to lead out the static charges accumulated on the first signal line in a case that the second level signal is applied to the second signal line and the first level signal is applied to the third signal line and the fourth signal line.

### Claim 4 (depends on 1)

The ESD and testing composite component according to claim 1, wherein the first TFT is an N-type TFT or a P-type TFT; and the second TFT is an N-type TFT or a P-type TFT.

### Claim 5 (depends on 1)

An array substrate, comprising the ESD and testing composite component according to claim 1.

### Claim 6 (depends on 5)

The array substrate according to claim 5, wherein the array substrate comprises a display region and a peripheral region disposed on an outside of the display region; and the ESD and testing composite component is disposed in the peripheral region.

### Claim 7 (depends on 5)

A display device, comprising the array substrate according to claim 5.

### Claim 8 (depends on 7)

The display device according to claim 7, wherein the display device comprises a liquid crystal display (LCD) device or an organic light-emitting diode (OLED) display device.

### Claim 9

An electrostatic discharge (ESD) and testing composite component, wherein the composite component comprises a first signal line, a first thin-film transistor (TFT) and a second TFT which are electrically connected with the first signal line, a second signal line electrically connected with the first TFT, and a third signal line and a fourth signal line which are electrically connected with the second TFT; and the composite component is configured to provide a testing signal for the first signal line at a first stage and configured to provide ESD for the first signal line at a second stage;
wherein the first TFT comprises a first gate electrode, a first source electrode and a first drain electrode, the first signal line is electrically connected with the first drain electrode and the second signal line is electrically connected with the first source electrode, or the first signal line is electrically connected with the first source electrode and the second signal line is electrically connected with the first drain electrode, and the first gate electrode is electrically connected with the first drain electrode or the first source electrode,
wherein the second TFT comprises a second gate electrode, a second source electrode and a second drain electrode, the first signal line is electrically connected with the second source electrode and the third signal line is electrically connected with the second drain electrode, or the first signal line is electrically connected with the second drain electrode and the third signal line is electrically connected with the second source electrode, and the second gate electrode is electrically connected with the fourth signal line, and
wherein the ESD and testing composite component further comprises a third TFT electrically connected with the first signal line and a fifth signal line electrically connected with the third TFT, the second TFT, the third signal line and the fourth signal line are configured to provide a testing signal for the first signal line at the first stage, and the first TFT, the third TFT, the second signal line and the fifth signal line are configured to provide ESD for the first signal line at the second stage.

### Claim 10 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the third TFT comprises a third gate electrode, a third source electrode and a third drain electrode; the fifth signal line is electrically connected with the third source electrode and the first signal line is electrically connected with the third drain electrode, or the fifth signal line is electrically connected with the third drain electrode and the first signal line is electrically connected with the third source electrode; the third gate electrode is electrically connected with the third drain electrode or the third source electrode; and the second drain electrode or the second source electrode of the second TFT also serves as the third source electrode or the third drain electrode of the third TFT.

### Claim 11 (depends on 10)

The ESD and testing composite component according to claim 10, wherein at the testing stage, the third signal line and the fourth signal line are high level signal lines or low level signal lines, and the second TFT is switched on and transmits a testing signal applied to the third signal line to the first signal line.

### Claim 12 (depends on 10)

The ESD and testing composite component according to claim 10, wherein the fifth signal line comprises a first portion; and the first portion of the fifth signal line also serves as the third source electrode or the third drain electrode.

### Claim 13 (depends on 9)

The ESD and testing composite component according to claim 9, wherein at the ESD stage, the second signal line is a low level signal line and the fifth signal line is a high level signal line, or the second signal line is a high level signal line and the fifth signal line is a low level signal line, so that static charges accumulated on the first signal line are led out through the first TFT and the second signal line or through the third TFT and the fifth signal line.

### Claim 14 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the third signal line and the fourth signal line are high level signal lines or low level signal lines together with the fifth signal line.

### Claim 15 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the third TFT is an N-type TFT or a P-type TFT.

### Claim 16 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the first signal line comprises a first portion; the second signal line comprises a first portion; the first portion of the first signal line also serves as the first drain electrode and the first portion of the second signal line also serves as the first source electrode; or the first portion of the first signal line also serves as the first source electrode and the first portion of the second signal line also serves as the first drain electrode.

### Claim 17 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the first signal line comprises a second portion; the third signal line comprises a first portion; the second portion of the first signal line also serves as the second source electrode, and the first portion of the third signal line also serves as the second drain electrode; or the second portion of the first signal line also serves as the second drain electrode, and the first portion of the third signal line also serves as the second source electrode.

### Claim 18 (depends on 9)

The ESD and testing composite component according to claim 9, wherein the fourth signal line comprises a first portion; and the first portion of the fourth signal line also serves as the second gate electrode.