# US 10,311,172 B2 · System analysis device and system analysis method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,311,172 B2 - Document ID: US10311172B2 - Status: Granted - Kind: B2 - Application number: 14/771,077 - Filed: 2014-03-07 - Published: 2016-01-07 - Granted: 2019-06-04 - Earliest claimed: 2013-03-13 - Assignees: NEC Corporation - Applicants: NEC Corporation - Inventors: Masanao Natsumeda - Web page: https://patentgrep.com/patent/US10311172B2 ## CPC - G06F 11/324: {Display of status information} - G05B 23/0254: {based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks} - G05B 23/0272: {Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user} - G06F 30/20: Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30) - G05B 2219/31455: Monitor process status - G05B 2219/31477: Display correlated data so as to represent the degree of correlation - G06F 11/323: {Visualisation of programs or trace data} - G06F 11/3452: {Performance evaluation by statistical analysis} - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) - G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G) ## Abstract In invariant relation analysis, a correlation diagram with improved visibility is obtained. A system analysis device (100) includes a correlation model storage unit (112), and the display control unit (105). The correlation model storage unit (112) stores the correlation model expressing correlations between metrics in the system. The display control unit (105) divides a display region into n divided regions such that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1. The display control unit 105 allocates each of the plurality of clusters obtained by tracking correlations contained in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number increases in accordance with increase in i. The display control unit 105 draws the cluster allocated to the respective divided region i in the divided region i. ## Claims ### Claim 1 A system analysis device comprising: a memory storing instructions, and one or more processors configured to execute the instructions to: store a correlation model expressing correlations between metrics respectively indicating performances of computer resources included in a system; and divide a display region into n divided regions in such a way that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1, allocate each cluster of a plurality of clusters obtained by tracking the correlations in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number of the clusters increases in accordance with increase in i, and draw the cluster allocated to the divided region i in the divided region i, determine a candidate of an abnormality cause metric based on correlation destruction detected by using the correlation model and measured values of metrics, emphasize a candidate of the abnormality cause metric on the cluster, and change a configuration of the system to handle a failure relating to the abnormality cause metric of the system indicated in response to output of the display region on which the plurality of clusters are drawn. ### Claim 2 (depends on 1) The system analysis device according to claim 1, wherein the number of clusters to be allocated to the divided region i is determined by using an exponential function that has i as a base. ### Claim 3 (depends on 1) The system analysis device according to claim 1, wherein the divided region i is divided into sub regions of a number equivalent to the number of the clusters allocated to the divided region i, and clusters allocated to the divided region i are drawn in the corresponding sub regions respectively. ### Claim 4 (depends on 1) The system analysis device according to claim 1, wherein a graph indicating a correlation between metrics contained in a cluster is drawn. ### Claim 5 (depends on 1) The system analysis device according to claim 1, wherein the display region is divided into the n divided regions in accordance with a predetermined division ratio. ### Claim 6 (depends on 1) The system analysis device according to claim 1, wherein the divided region i of the n divided regions is arranged on the display region in the order of i. ### Claim 7 A system analysis method comprising: storing, by a processor, a correlation model expressing correlations between metrics respectively indicating performances of computer resources included in a system; dividing, by the processor, a display region into n divided regions in such a way that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1, allocating each cluster of a plurality of clusters obtained by tracking the correlations in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number of the clusters increases in accordance with increase in i, and drawing the cluster allocated to the divided region i in the divided region i; determining, by the processor, a candidate of an abnormality cause metric based on correlation destruction detected by using the correlation model and measured values of metrics; emphasizing, by the processor, a candidate of the abnormality cause metric on the cluster; and changing a configuration of the system to handle, by the processor, a failure relating to the abnormality cause metric of the system indicated in response to output of the display region on which the plurality of clusters are drawn. ### Claim 8 (depends on 7) The system analysis method according to claim 7, wherein, when allocating each cluster of the plurality of clusters, determining the number of clusters to be allocated to the divided region i by using an exponential function that has i as a base. ### Claim 9 (depends on 7) The system analysis method according to claim 7, wherein, when drawing the cluster allocated to the divided region i, dividing the divided region i into sub regions of a number equivalent to the number of the clusters allocated to the divided region i, and draws clusters allocated to the divided region i in the corresponding sub regions respectively. ### Claim 10 (depends on 7) The system analysis method according to claim 7, wherein, when drawing the cluster allocated to the divided region i, drawing a graph indicating a correlation between metrics contained in a cluster. ### Claim 11 (depends on 7) The system analysis method according to claim 7, wherein, when dividing the display region, dividing the display region into the n divided regions in accordance with a predetermined division ratio. ### Claim 12 (depends on 7) The system analysis method according to claim 7, wherein, when dividing the display region, arranging the divided region i of the n divided regions on the display region in the order of i. ### Claim 13 A non-transitory computer readable storage medium recording thereon a program, causing a computer to perform a method comprising: storing a correlation model expressing correlations between metrics respectively indicating performances of computer resources included in a system; dividing a display region into n divided regions in such a way that an area of a divided region i (1≤i≤n) is equal to or larger than an area of a divided region i+1, allocating each cluster of a plurality of clusters obtained by tracking the correlations in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number of the clusters increases in accordance with increase in i, and drawing the cluster allocated to the divided region i in the divided region i; determining a candidate of an abnormality cause metric based on correlation destruction detected by using the correlation model and measured values of metrics; emphasizing a candidate of the abnormality cause metric on the cluster; and changing a configuration of the system to handle a failure relating to the abnormality cause metric of the system indicated in response to output of the display region on which the plurality of clusters are drawn. ### Claim 14 (depends on 13) The non-transitory computer readable storage medium recording thereon the program according to claim 13, wherein, when allocating each cluster of the plurality of clusters, determining the number of clusters to be allocated to the divided region i by using an exponential function that has i as a base. ### Claim 15 (depends on 13) The non-transitory computer readable storage medium recording thereon the program according to claim 13, wherein, when drawing the cluster allocated to the divided region i, dividing the divided region i into sub regions of a number equivalent to the number of the clusters allocated to the divided region i, and draws clusters allocated to the divided region i in the corresponding sub regions respectively. ### Claim 16 (depends on 13) The non-transitory computer readable storage medium recording thereon the program according to claim 13, wherein, when drawing the cluster allocated to the divided region i, drawing a graph indicating a correlation between metrics contained in a cluster. ### Claim 17 (depends on 13) The non-transitory computer readable storage medium recording thereon the program according to claim 13, wherein, when dividing the display region, dividing the display region into the n divided regions in accordance with a predetermined division ratio. ### Claim 18 (depends on 13) The non-transitory computer readable storage medium recording thereon the program according to claim 13, wherein, when dividing the display region, arranging the divided region i of the n divided regions on the display region in the order of i.