# US 10,310,096 B2 · Device and method for detecting radiation > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,310,096 B2 - Document ID: US10310096B2 - Status: Granted - Kind: B2 - Application number: 15/742,207 - Filed: 2016-06-30 - Published: 2019-03-07 - Granted: 2019-06-04 - Earliest claimed: 2015-07-07 - Applicants: Alfred Fuchs - Inventors: Alfred Fuchs - Web page: https://patentgrep.com/patent/US10310096B2 ## CPC - G01T 1/1606: {with other specified detectors not provided for in the other subgroups of G01T1/16} - G01T 1/17: Circuit arrangements not adapted to a particular type of detector {(pulse-selection circuits H03K, G01R)} - B82Y 10/00: Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic - H10N 60/84: Switching means for devices switchable between superconducting and normal states - G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N23/00; tubes for determining the presence, intensity, density or energy of radiation or particles H01J47/00) - B82Y: SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES - H10N: ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR ## Abstract An apparatus (7) for detecting radiation, preferably x-ray radiation, the apparatus comprising at least one detector element (11) which comprises an absorber element (1) for the radiation and a nanowire (2) made of a superconducting material in thermally conducting communication with the absorber element (1), wherein cooling means (34) are provided in order to cool the absorber element (1) and the nanowire (2) to a temperature in the range of the transition temperature of the nanowire (2) in an operating state of the apparatus (7) and wherein an evaluation and control unit (6) is provided to determine whether the nanowire (2) is in a superconducting state or not. According to the invention it is provided that at least one heating means (8) which can be controlled by means of the evaluation and control unit (6) is provided in order to be able to supply a thermal energy pulse to the absorber element (1), wherein the evaluation and control unit (6) is designed to continuously supply energy pulses to the absorber element (1) in the operating state of the apparatus (7) as long as the nanowire (2) is in the superconducting state. ## Claims ### Claim 1 An apparatus for detecting radiation, the apparatus comprising at least one detector element which comprises an absorber element for the radiation and a nanowire made of a superconducting material in thermally conducting communication with the absorber element, wherein cooling means are provided in order to cool the absorber element and the nanowire of the at least one detector element to a temperature in the range of the transition temperature of the nanowire in an operating state of the apparatus and wherein an evaluation and control unit is provided to determine whether the nanowire of the at least one detector element is in a superconducting state or not, characterized in that at least one heating means which can be controlled by means of the evaluation and control unit is provided in order to be able to supply a thermal energy pulse to the absorber element of the at least one detector element, wherein the evaluation and control unit is designed to continuously supply energy pulses to the absorber element of the at least one detector element in the operating state of the apparatus as long as the nanowire of the at least one detector element is in the superconducting state. ### Claim 2 (depends on 1) The apparatus according to claim 1, characterized in that an Ohmic resistance is provided as the at least one heating means which is connected in a thermally conducting manner to the absorber of the at least one detector element. ### Claim 3 (depends on 1) The apparatus according to claim 1, characterized in that a power source is provided in order to operate the nanowire of the at least one detector element in the operating state of the apparatus in the range of 70% to 99% of its critical current density. ### Claim 4 (depends on 3) The apparatus of claim 3 wherein the range comprises 80% to 95%. ### Claim 5 (depends on 1) The apparatus according to claim 1, characterized in that the at least one detector element is disposed in a thermally insulated container which has a window for the radiation to be detected. ### Claim 6 (depends on 1) The apparatus according to claim 1, characterized in that the nanowire of the at least one detector element is made of niobium nitride or tantalum nitride. ### Claim 7 (depends on 1) The apparatus according to claim 1, characterized in that the absorber element of the at least one detector element is made of bismuth. ### Claim 8 (depends on 1) The apparatus according to claim 1, characterized in that the absorber element of the at least one detector element is deposited on the nanowire of the at least one detector element. ### Claim 9 (depends on 1) The apparatus according to claim 1, characterized in that a plurality of detector elements are provided. ### Claim 10 (depends on 9) The apparatus according to claim 9, characterized in that the detector elements are arranged along at least one line. ### Claim 11 (depends on 10) The apparatus of claim 10 wherein the at least one line comprises a plurality of lines. ### Claim 12 (depends on 11) The apparatus of claim 11 wherein the plurality of lines comprises a plurality of parallel lines. ### Claim 13 (depends on 8) Arrangement for determining radiation scattered in an object to be investigated and radiation attenuated in the object to be investigated, the arrangement comprising a radiation source for generating a fan beam with partial beams having different fan angles for illuminating the object to be investigated at different directions of incidence lying in a fan central plane, the arrangement further comprising a first apparatus according to claim 8 and a second apparatus according to claim 8, wherein at least a part of the detector elements of the first apparatus is arranged downstream of the object to be investigated when viewed in the directions of incidence and wherein at least a part of the detector elements of the second apparatus is arranged laterally offset with respect to the detector elements of the first apparatus when viewed parallel to an axis connecting the radiation source and the object to be investigated. ### Claim 14 (depends on 13) The arrangement according to claim 13, characterized in that the detector elements of the first apparatus are arranged along a line which preferably lies in the fan central plane, that the detector elements of the second apparatus are arranged along a plurality of lines and that when viewed from the radiation source, the lines of the detector elements of the second apparatus alternately with respect to one another and preferably with respect to the line of the detector elements of the first apparatus have an offset angle which is measured in a normal plane which is normal to the fan central plane. ### Claim 15 (depends on 14) The arrangement according to claim 14, characterized in that the course of the plurality of lines of the detector elements of the second apparatus substantially follows the course of the line of the detector elements of the first apparatus. ### Claim 16 (depends on 14) The arrangement according to claim 14, characterized in that the detector elements of the first apparatus are additionally arranged along a further line, that the detector elements of the second apparatus are additionally arranged along further lines and that when viewed from the radiation source, the further lines of the detector elements of the second apparatus alternately with respect to one another and preferably with respect to the further line of the detector elements of the first apparatus have a further offset angle which is measured in the normal plane. ### Claim 17 (depends on 16) The arrangement according to claim 16, characterized in that the detector elements of the first apparatus are arranged between the detector elements of the second apparatus. ### Claim 18 (depends on 16) The arrangement according to claim 16, characterized in that the course of the further line of the detector elements of the first apparatus substantially follows the course of the line of the detector elements of the first apparatus and that the course of the further lines of the detector elements of the second apparatus substantially follows the course of the further line of the detector elements of the first apparatus. ### Claim 19 (depends on 16) The arrangement according to claim 16, characterized in that when viewed from the radiation source the detector elements of the line and the further line of the first apparatus have an offset angle with respect to one another which is measured in the fan central plane. ### Claim 20 (depends on 19) The arrangement according to claim 19, characterized in that when viewed from the radiation source, the detector elements of the lines and the further lines of the second apparatus have the offset angle with respect to one another. ### Claim 21 (depends on 14) The arrangement according to claim 14, characterized in that collimator septa are only provided between detector elements of the second apparatus. ### Claim 22 (depends on 21) The arrangement of claim 21 wherein the collimator septa are arranged between detector elements of the second apparatus which are arranged successively along one of the lines and/or further lines. ### Claim 23 (depends on 13) The arrangement according to claim 13, characterized in that the detector elements of the first apparatus are arranged in a first plane on a two-dimensional grid, that the detector elements of the second apparatus are arranged in a second plane parallel to the first plane which, when viewed from the radiation source, is arranged downstream of the first plane, and that when viewed in a normal direction normal to the two planes, the detector elements of the second apparatus are arranged in gaps between the detector elements of the first apparatus. ### Claim 24 (depends on 8, 23) The arrangement according to claim 23, characterized in that a third apparatus according to claim 8 is provided whose detector elements are arranged in a third plane which is arranged parallel to the first plane and second plane as well as between the first plane and second plane, wherein the detector elements of the third apparatus when viewed in the normal direction are covered by the detector elements of the first apparatus. ### Claim 25 A method for detecting radiation by means of a detector element which comprises an absorber element and a nanowire made of a superconducting material in thermally conducting communication with the absorber element, wherein the absorber element and the nanowire are cooled to a temperature in the range of the transition temperature of the nanowire, wherein the radiation is absorbed by means of the absorber element and wherein it is continuously determined whether the nanowire is in a superconducting state or not, characterized in that energy pulses are continuously supplied to the absorber element by means of a heating means, as long as the nanowire is in the superconducting state and the power which is hereby supplied to the absorber element is determined. ### Claim 26 (depends on 25) A method for determining radiation scattered in an object to be investigated and radiation attenuated in the object to be investigated, wherein the object to be investigated is illuminated by a fan beam with partial beams having different fan angles, wherein by means of a method according to claim 25, a sum of partial beams attenuated in the object to be investigated and radiation scattered in the object to be investigated is measured, wherein the measurement is made in at least one dimension by means of a plurality of detector elements in a spatially resolved manner such that the individual partial beams are spatially resolved. ### Claim 27 (depends on 26) The method according to claim 26, wherein exclusively scattered radiation is measured, wherein the measurement is made in at least one dimension by means of the detector elements in a spatially resolved manner at least at those locations in which with an assumed rotationally symmetrical spatial distribution of the scattered radiation of each partial beam the same proportion of the respective partial beam would be scattered as in a location at which an attenuated partial beam adjacent to the respective partial beam is measured. ### Claim 28 (depends on 27) The method according to claim 27, characterized in that for the locations at which the attenuated partial beams are measured, the exclusively attenuated radiation is computed by subtracting in each case from the measured sum of the attenuated radiation and scattered radiation corresponding parts of the measured exclusively scattered radiation. ### Claim 29 (depends on 1) The apparatus of claim 1 wherein the radiation comprises x-ray radiation. ### Claim 30 (depends on 25) The method of claim 25 wherein the radiation comprises x-ray radiation.