# US 10,309,989 B2 · Measurement apparatus > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,309,989 B2 - Document ID: US10309989B2 - Status: Granted - Kind: B2 - Application number: 15/728,257 - Filed: 2017-10-09 - Published: 2018-02-01 - Granted: 2019-06-04 - Earliest claimed: 2010-04-15 - Assignees: Infineon Technologies AG - Applicants: Infineon Technologies AG - Inventors: Peter Bogner; Franz Kuttner - Web page: https://patentgrep.com/patent/US10309989B2 ## CPC - G01R 15/06: having reactive components, e.g. capacitive transformer - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract Measurement apparatuses and methods are described. A measurement input is coupled with a first terminal of a capacitance via a first switch, and a reference voltage is coupled with the first terminal of the capacitance via a second switch. A measurement circuit is coupled to a second terminal of said capacitance. ## Claims ### Claim 1 A device, comprising: an input portion consisting of a first switch and a second switch; wherein the first switch is coupled between a measurement input and a first node, and wherein the second switch is coupled between said first node and a reference voltage node at a first reference voltage, a capacitance, wherein a first terminal of said capacitance is coupled with said first node, and a second terminal of said capacitance is coupled with a second node, and a measurement circuit that comprises second-voltage-rated components only, wherein a terminal of said measurement circuit is coupled to the second node, wherein said first switch, said second switch and said capacitance are first-voltage rated components, wherein the first-voltage rated components are designed to tolerate a first voltage magnitude of greater than five volts and wherein the second-voltage rated components are designed to tolerate a second non-zero voltage magnitude smaller than said first voltage magnitude. ### Claim 2 (depends on 1) The apparatus of claim 1, further comprising at least one switchable further capacitance, wherein a first terminal of said at least one switchable further capacitance is coupled with the second node between said second terminal of said capacitance and said measurement circuit. ### Claim 3 (depends on 2) The apparatus of claim 2, wherein a second terminal of said at least one switchable further capacitance is switchably coupled with either a second reference voltage or a third reference voltage. ### Claim 4 (depends on 2) The apparatus of claim 2, wherein said at least further switchable capacitance forms part of a capacitive digital-to-analog converter. ### Claim 5 (depends on 2) The apparatus of claim 2, wherein said at least one switchable capacitance comprises a plurality of switchable further capacitances, said further capacitances having binary weighted capacitance values. ### Claim 6 (depends on 2) The apparatus of claim 2, wherein said at least one switchable capacitance comprises a plurality of switchable further capacitances, said further capacitances having nominally equal values. ### Claim 7 (depends on 1) The circuit of claim 1, wherein said first switch comprises a PMOS transistor and said second switch comprises an NMOS transistor. ### Claim 8 (depends on 1) The apparatus of claim 1, wherein said measurement circuit comprises at least one of a buffer, an integrator and an analog-to-digital converter. ### Claim 9 An apparatus, comprising: a first capacitance, an input portion consisting of a first switch and a second switch, a voltage input coupled with a first terminal of said first capacitance via said first switch, a reference voltage node at a first reference voltage coupled to said first terminal of said first capacitance via said second switch, a comparator, wherein a first input of said comparator is coupled with a second terminal of said first capacitance, a successive approximation register that is coupled with an output of said comparator, and an array of second capacitances, wherein each one capacitance of said array of second capacitances has a first terminal that is coupled with said first input of said comparator and a second terminal that is selectively coupled with a further reference voltage node, wherein said first switch, said second switch and said first capacitance are first-voltage rated components designed to tolerate a first voltage magnitude of greater than five volts, wherein said comparator, said successive approximation register and each capacitance of said array of second capacitances are second-voltage rated components, and wherein the second-voltage rated components are designed to tolerate a second non-zero voltage magnitude smaller than said first voltage magnitude. ### Claim 10 (depends on 9) The apparatus of claim 9, wherein said second terminal of each of said second capacitances is configured to be coupled with a second reference voltage or a third reference voltage at the further reference voltage node. ### Claim 11 (depends on 9) The apparatus of claim 9, further comprising an array of switches, each switch of said array of switches being coupled with one of said second terminal of said second capacitances to perform said selective coupling. ### Claim 12 (depends on 11) The apparatus of claim 11, wherein said array of switches is controlled by said successive approximation register. ### Claim 13 (depends on 9) The apparatus of claim 9, wherein a second input of said comparator is configured to be coupled with a fourth reference voltage. ### Claim 14 (depends on 9) The apparatus of claim 9, wherein said output of said comparator is coupled with said first input of said comparator via a third switch. ### Claim 15 (depends on 9) The apparatus of claim 9, wherein said first switch and said second switch are controllable such that when one of said first switch and said second switch is closed, the other one of said first switch and said second switch is open. ### Claim 16 (depends on 9) The apparatus of claim 9, wherein said first switch and said second switch comprise a MOS transistor or a bipolar transistor. ### Claim 17 (depends on 9) The apparatus of claim 9, wherein a capacitance value of said first capacitance is matched with each capacitance value of said second capacitances. ### Claim 18 A method, comprising: alternately applying an input voltage and a first reference voltage to a first input of a capacitor via an input portion of a device, wherein the input portion consists of a first switch and a second switch, such that the first switch is coupled between the input voltage and the first input of the capacitor and the second switch is coupled between the first reference voltage and the first input of the capacitor, coupling a second terminal of said capacitor to a comparator, and determining a bit value of an output signal based on an output of said comparator, wherein said first switch, said second switch and said capacitance are first-voltage rated components designed to tolerate a first voltage magnitude of greater than five volts, wherein said comparator is a second-voltage rated component, and wherein the second-voltage rated component is designed to tolerate a second non-zero voltage magnitude smaller than said first voltage magnitude. ### Claim 19 (depends on 18) The method of claim 18, further comprising selectively coupling second terminals of further capacitances of a capacitance array either with a second reference voltage or a third reference voltage, wherein first terminals of said further capacitances being coupled to said comparator. ### Claim 20 (depends on 19) The method of claim 19, further comprising coupling an output of said comparator to an input of said comparator.