CMOS image sensor with buried superlattice layer to reduce crosstalk
AssigneeAtomera Incorporated
InventorsYi-Ann Chen, Abid Husain, Hideki Takeuchi
Life of this patent
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AssigneeAtomera Incorporated
InventorsYi-Ann Chen, Abid Husain, Hideki Takeuchi
Estimating the term…
A CMOS image sensor may include a semiconductor substrate having a first conductivity type, and a superlattice on the semiconductor substrate including a plurality of stacked groups of layers. Each group of layers may include a plurality of stacked base semiconductor monolayers defining a base semiconductor portion, and a non-semiconductor monolayer(s) constrained within a crystal lattice of adjacent base semiconductor portions. The image sensor may further include a plurality of laterally adjacent photodiodes on the superlattice. Each photodiode may include a semiconductor layer on the superlattice and having a first conductivity type dopant and with a lower dopant concentration than the semiconductor substrate, a retrograde well extending downward into the semiconductor layer from a surface thereof and having a second conductivity type, a first well around a periphery of the retrograde well having the first conductivity type, and a second well within the retrograde well having the first conductivity type.
A CMOS image sensor comprising:
A CMOS image sensor comprising:
A CMOS image sensor comprising:
Dependencies are inferred from the claim text.