Talbot X-ray microscope
AssigneeSigray, Inc.
InventorsWenbing Yun, David Vine, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri
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AssigneeSigray, Inc.
InventorsWenbing Yun, David Vine, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri
Estimating the term…
Systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro-or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using a arrayed x-ray source and a set of Talbot interference fringes.
An x-ray microscope system comprising:
A method for measuring the x-ray transmission of an object, the method comprising:
Dependencies are inferred from the claim text.