System and method for testing and configuration of an FPGA
AssigneeMenta
InventorsLaurent Rouge, Julien Eydoux, Marcello Giuffre
Life of this patent
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AssigneeMenta
InventorsLaurent Rouge, Julien Eydoux, Marcello Giuffre
Estimating the term…
Configuration values for Lookup tables (LUTs) and programmable routing switches in an FPGA are provided by means of a number of flip flops arranges in a shift register. This shift register may receive test values in a factory test mode, and operational configuration values (implementing whatever functionality the client requires of the FPGA) in an operational mode. The bitstreams are provided at one end of the shift register, and clocked through until the last flip flop receives its value. Values may also be clocked out at the other end of the shift register to be compared to the initial bitstream in order to identify corruption of stored values e.g. due to radiation exposure. A clock gating architecture is proposed for loading data to or reading data from specific selected shift registers.
A Field Programmable Gate Array capable of implementing a logic function said Field Programmable Gate Array comprising a plurality of hardware lookup tables, the select lines or outputs of each lookup table being programmably interconnected with the select lines or outputs of another said lookup table by means of a plurality of programmable switches said Field Programmable Gate Array further comprising:
Dependencies are inferred from the claim text.