Pre-test power-optimized bin reassignment following selective voltage binning

A method comprising:

• taking measurements from integrated circuit chips, said measurements comprising at least a performance measurement and a leakage power measurement from each of said integrated circuit chips, said performance measurement comprising a delay measurement;
• performing selective voltage binning of said integrated circuit chips,
• wherein said selective voltage binning comprising assigning said integrated circuit chips to different voltage bins,
• wherein said different voltage bins comprising at least:
• a first voltage bin associated with a first performance range and a first leakage power screen value;
• and
• a second voltage bin associated with a second performance range that is slower than said first performance range and a second leakage power screen value that is lower than said first leakage power screen value, and
• wherein said assigning comprising:
• assigning any of said integrated circuit chips having corresponding performance measurements within said first performance range to said first voltage bin;
• and
• assigning any of said integrated circuit chips having corresponding performance measurements within said second performance range to said second voltage bin;
• and,
• determining whether to reassign each specific integrated circuit chip having a corresponding performance measurement within said first performance range from said first voltage bin to said second voltage bin based on a comparison of said first leakage power screen value of said first voltage bin to a corresponding leakage power measurement taken from said specific integrated circuit chip and further based on a comparison of said second leakage power screen value of said second voltage bin to said corresponding leakage power measurement;
• said first voltage bin being associated with first testing parameters and said second voltage bin being associated with second testing parameters that are different from the first testing parameters, and
• said method further comprising, after reassigning said specific integrated circuit chip from said first voltage bin to said second voltage bin, performance testing said specific integrated circuit chip using said second testing parameters and dispositioning said specific integrated circuit chip based on results of performance testing.

A computer program product comprising a computer readable storage medium having program instructions embodied therewith, said program instructions being executable by a computer to cause said computer to perform a method, said method comprising:

• performing selective voltage binning comprising assigning integrated circuit chips having a same design to voltage bins, said voltage bins comprising at least:
• a first voltage bin associated with a first performance range and a first leakage power screen value;
• and
• a second voltage bin associated with a second performance range that is slower than said first performance range and a second leakage power screen value that is lower than said first leakage power screen value;
• and,
• determining whether to reassign an integrated circuit chip from said first voltage bin to said second voltage bin based on a comparison of said first leakage power screen value to a leakage power measurement taken from said integrated circuit chip and on a comparison of said second leakage power screen value to said leakage power measurement;
• said first voltage bin being associated with first testing parameters and said second voltage bin being associated with second testing parameters that are different from the first testing parameters, and
• said method further comprising, after reassigning said integrated circuit chip from said first voltage bin to said second voltage bin, performance testing said integrated circuit chip using said second testing parameters and dispositioning said integrated circuit chip based on results of said performance testing.