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US 10,295,589 B2Granted
Electromigration wearout detection circuits
AssigneeInternational Business Machines Corporation
InventorsKeith A. Jenkins, Siyuranga O. Koswatta
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AssigneeInternational Business Machines Corporation
InventorsKeith A. Jenkins, Siyuranga O. Koswatta
Estimating the term…
Embodiments include methods, and systems of an integrated circuit having electromigration wearout detection circuits. Integrated circuit may include a detection element and a reference element. Detection element is subject to normal operation current. Reference element is not subject to normal operation current. A resistance of detection element is monitored to detect electromigration wearout. The electromigration wearout detection monitoring circuit may be configured to perform: periodically measuring resistance of detection element, calculating resistance change of detection element over a predetermined time period, comparing resistance change of detection element calculated to a predetermined safety threshold, and take mitigation actions when resistance change of detection element exceeds predetermined safety threshold. The mitigation actions may include switching to a redundant circuit of the integrated circuit, shutting down the integrated circuit, and sending a signal to initiate a service call. The predetermined safety threshold may be 1% of resistance change of the detection element.
An electromigration wearout detection circuit comprising:
A method of electromigration wearout detection comprising:
A method of electromigration wearout detection comprising:
Dependencies are inferred from the claim text.