Circuit for measuring flicker noise and method of using the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChao Chieh Li, Ruey-Bin Sheen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChao Chieh Li, Ruey-Bin Sheen
Estimating the term…
A flicker noise measurement circuit includes a first section. The first section includes a plurality of first stages connected in series. The first section includes a first feedback switching element configured to selectively feedback an output of the plurality of first stages to an input of the plurality of first stages. The first section includes a first section connection switching element. The flicker noise measurement circuit includes a second section connected to the first section. The second section includes a plurality of second stages connected in series, wherein the first section connection switching element is configured to selectively connect the plurality of second stages to the plurality of first stages. The second section includes a second feedback switching element configured to selectively feedback an output of the plurality of second stages to the input of the plurality of first stages.
A method of determining flicker noise, the method comprising:
Dependencies are inferred from the claim text.