Optical electrical measurement system, a measurement probe and a method therefor
AssigneeTelefonaktiebolaget LM Ericsson (publ)
InventorsSverker Sander, Björn Olsson
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Abstract
The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.
Claims20
A method for measuring an electrical property of an electrical circuit, comprising:
- measuring the electrical property using a measurement probe connected to the electrical circuit;
- converting the measured electrical property of the electrical circuit to an optical signal;
- sending the optical signal;
- receiving the optical signal using an image sensor configured to record images comprising the measurement probe that transmits the optical signal;
- and
- processing the recorded images in order to decode the measurement data from the received optical signal.
A measurement system for measuring an electrical property of a connectable electrical circuit, comprising:
- a measurement probe configured to be connected to the connectable electrical circuit, wherein the measurement probe is configured to measure the electrical property of the connectable electrical circuit and to send information about the electrical property as an optical signal;
- an image sensor configured to record images of the optical signal transmitted from the measurement probe;
- and
- a processing circuitry configured to receive the recorded images from the image sensor and to control the image sensor, wherein the processing circuitry is configured to:
- control the image sensor to record images such that the optical information from the measurement probe is captured on the images;
- and
- process the recorded images in order to decode the measurement data from the received optical signal.
Dependencies are inferred from the claim text.