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US 10,295,567 B2Granted
Probe module supporting loopback test
AssigneeMpi Corporation
InventorsWei-Cheng Ku, Hao Wei, Jun-Liang Lai, Chih-Hao Ho
Life of this patent
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AssigneeMpi Corporation
InventorsWei-Cheng Ku, Hao Wei, Jun-Liang Lai, Chih-Hao Ho
Estimating the term…
A probe module, which supports loopback test and is provided between a PCB and a DUT, includes an adapter, two probes, two inductive components provided at the adapter, and a capacitive component. The adapter has two connecting circuits. An end of each of the probes is connected to one of the connecting circuits, while another end thereof, which is a tip, contacts the DUT. Each of the inductive components has an end electrically connected to one of the connecting circuits, and another end electrically connected to the PCB through a conductive member, which is provided at the adapter, wherein two ends of the capacitive component are electrically connected to one of the connecting circuits, respectively. Whereby, the signal paths are changed by the differences between frequencies of signals, and the transmission path of high-frequency signals is effectively shortened.
A probe module, which is provided between a printed circuit board (PCB) and a device-under-test (DUT) to perform a loopback test, comprising:
A probe module, which is provided between a printed circuit board (PCB) and a device-under-test (DUT) to perform a loopback test, comprising:
Dependencies are inferred from the claim text.