Method of providing a high density test contact solution
AssigneeDpix, LLC
InventorsKevin Cadena, Kevin Granaas, John Luther, Shawn Michael O'Rourke
Life of this patent
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Abstract
A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer, without a specific connector pattern associated either with the transport layer or a device under test.
Claims20
A flexible probe card comprising:
- in an uncompressed state of the flexible probe card,
- a compression layer comprising a substantially planar first surface and a substantially planar second surface;
- a transport layer comprising a substantially planar first surface and a substantially planar second surface, wherein the entirety of the substantially planar first surface is directly coupled to the entirety of the substantially planar second surface of the compression layer;
- and
- a contact layer comprising a substantially planar first surface and a substantially planar second surface, wherein the entirety of the substantially planar first surface is directly coupled to the entirety of the substantially planar second surface of the transport layer.
A testing system comprising:
- a flexible probe card comprising a compression layer, a transport layer, and a contact layer;
- a device interface board in electrical communication with the flexible probe card;
- and
- a test control system in electrical communication with the device interface board,
- wherein, in an uncompressed state of the flexible probe card, the compression layer comprises a substantially planar first surface and a substantially planar second surface;
- the transport layer comprises a substantially planar first surface and a substantially planar second surface, wherein the entirety of the substantially planar first surface is directly coupled to the entirety of the substantially planar second surface of the compression layer;
- and the contact layer comprises a substantially planar first surface and a substantially planar second surface, wherein the entirety of the substantially planar first surface is directly coupled to the entirety of the substantially planar second surface of the transport layer.
A flexible probe card comprising:
- a compression layer comprising encapsulated closed cell polyurethane foam;
- a transport layer coupled to the compression layer comprising a flexible circuit material, a plurality of connectors configured to interface to a tester, and a plurality of contacts mirroring a plurality of contacts of a device under test;
- and
- a contact layer coupled to the transport layer comprising a plurality of contact wires arranged in a square pattern and suspended in silicon rubber configured for contacting the plurality of contacts of the device under test and for contacting the plurality of contacts of the transport layer.
Dependencies are inferred from the claim text.