Probe card with stress relieving feature
AssigneeCeladon Systems, Inc.
InventorsJohn L. Dunklee, William A. Funk
Life of this patent
Estimating the term…
Abstract
A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
Claims11
A probe card assembly, comprising:
- a probe card plate;
- a probe core, wherein the probe core includes a bonding portion for fixing the probe core to the probe card plate;
- and
- an expansion gap defined in the probe card plate, wherein the expansion gap extends around and surrounds the probe core.
A probe card assembly, comprising:
- a probe card plate;
- a tube, the tube configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate, wherein the tube includes one or more expansion gaps formed in a surface of the tube adjacent to the probe card plate and extending in a direction substantially parallel to a longitudinal axis of the tube from a first end of the tube to a second end of the tube;
- and
- a probe core, wherein the probe core includes a bonding portion for fixing the probe core to the tube.
Dependencies are inferred from the claim text.