Apparatus for clamping a probe card and probe card including the same

A probe card comprising:

• a printed circuit board (PCB) configured to be between an object to be tested and a test head;
• a multi-layered substrate configured to be arranged between the PCB and the object to be tested;
• a plurality of needles provided to the multi-layered substrate and configured to make electrical contact with the object to be tested;
• a stiffener arranged between the PCB and the test head;
• and
• a clamping apparatus including,
• a body portion arranged between the PCB and the test head,
• an inner clamping portion integrally formed with an upper surface of the body portion to affix a central portion of the PCB to the test head,
• a plurality of outer clamping portions integrally formed with a side surface of the body portion to affix a portion of the PCB, which is configured to surround the central portion of the PCB, to the test head, and
• a plurality of auxiliary clamping portions integrally formed with the body portion configured to extend from a side surface of the plurality of outer clamping portions, configured to attach to a top surface of the stiffener, and arranged between the test head and the stiffener.

A clamping apparatus, the clamping apparatus comprising:

• a single piece including,
• a body,
• an inner clamping portion,
• a plurality of outer clamping portions, and
• a plurality of auxiliary clamping portions extending from a side surface of at least one of the plurality of outer clamping portions, the plurality of auxiliary clamping portions being configured to attach to a stiffener,
• the clamping apparatus being configured to clamp a probe card.