Raman spectroscopy system

A system for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation, comprising

• an electromagnetic radiation source for emitting electromagnetic radiation onto the object;
• at least one detector for detecting at least part of the in-elastic scattered electromagnetic radiation from the object, the detector is arranged in a spectrograph unit for detecting a wavelength spectrum of in-elastic scattered electromagnetic radiation from the object;
• a tunable lens assembly comprising a tunable lens provided in the beam path between the electromagnetic radiation source and the object and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object;
• and
• a control unit connected to the tunable lens, and arranged to control the optical characteristic operation setting of the tunable lens assembly by imposing a first setting control operation signal to the tunable lens assembly, the first setting control operation signal comprising information relating to a first focal length, first beam shape, and/or first beam position attainable,
• the control unit is further connected to the at least one detector for receiving at least a first spectrum of the in-elastic scattered electromagnetic radiation from the object while using the first setting of the tunable lens assembly, wherein the control unit is arranged to:
• analyze the detected portion of in-elastic scattered electromagnetic radiation by comparing an optical characteristic of the first spectrum to a reference and decide whether the first setting should be changed to a second setting of the tunable lens assembly, and in the event a decision to change the first setting to a second setting is taken the control unit is further configured to
• transmit a second setting control operation signal associated with the second setting to the electrically tunable lens assembly, the second setting comprising information relating to a second focal length, second beam shape and/or second beam position attainable by the tunable lens assembly, wherein the decision to change to a second setting of the tunable lens assembly is based on:
• the presence of a first level of fluorescence being higher than a predetermined threshold in the first spectrum, whereby the second setting is associated with an increased beam shape compared to that of the first setting,
• the presence of a second level of fluorescence being lower than the predetermined level in the first spectrum, whereby the second setting is associated with a decreased beam shape compared to that of the first setting, or
• the presence of no fluorescence or a third level of fluorescence being lower than a second level, whereby the second setting is associated with a second focal length or second beam position.