Charged particle radiation measuring method and charged particle radiation measuring device
AssigneesDenka Company Limited, National University Corporation Gunma University, National Institutes for Quantum and Radiological Science and Technology
InventorsWataru Kada, Kenta Miura, Osamu Hanaizumi, Tomihiro Kamiya, Takahiro Satoh, Junichi Susaki, Suzuya Yamada
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Abstract
[Problem] To provide highly heat-resistant and radiation-resistant radiation measuring equipment. [Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.
Claims2
A charged particle radiation measuring method utilizing a scintillator comprising a phosphor in which the main component is a SiAlON phosphor, wherein the SiAlON phosphor is a phosphor in which the main component is a β-type SiAlON represented by the general formula:
- EuxSi6−zAlzOzN8−z, where 0.01≤x≤0.5 and 0<z≤4.2, and having an Eu luminescence center.
A charged particle radiation measuring device comprising:
- a scintillator comprising a phosphor in which the main component is a SiAlON phosphor;
- an optical component that selectively collects light from the scintillator;
- and a measuring portion that reads out light generated by radiation, wherein the SiAlON phosphor is a phosphor in which the main component is a β-type SiAlON represented by the general formula:
- EuxSi6−zAlzOzN8−z, where 0.01≤x≤0.5 and 0<z≤4.2, and having an Eu luminescence center.
Dependencies are inferred from the claim text.