Power semiconductor device and method for manufacturing same
AssigneeMitsubishi Electric Corporation
InventorsYasunari Hino, Kiyoshi Arai
Life of this patent
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Abstract
In a power semiconductor device, an IGBT has a collector electrode bonded to a metal plate by a bonding material. A diode has a cathode electrode bonded to the metal plate by the bonding material. An interconnection member is bonded to an emitter electrode of the IGBT by a bonding material. The bonding material includes a bonding material and a bonding material. The bonding material is interposed between the IGBT and the interconnection member. The bonding material fills a through hole formed in the interconnection member. The bonding material reaches the bonding material and is therefore connected to the bonding material.
Claims4
A power semiconductor device comprising:
- a semiconductor element including a first power element having a first surface and a second surface opposite to each other;
- a heat dissipation plate including a first conductor plate bonded to the first surface of the first power element;
- a conductor portion including a first interconnection member that is bonded to the second surface of the first power element and that is electrically connected to the first power element;
- a bonding material including a first bonding material for bonding the first surface of the first power element to the first conductor plate, and a second bonding material for bonding the second surface of the first power element to the first interconnection member;
- and
- a sealing material for sealing the semiconductor element, the conductor portion, and the heat dissipation plate, wherein
- the bonding material further includes an intermetallic compound,
- the second bonding material includes
- a first portion interposed between the second surface of the first power element and the first interconnection member, and
- a second portion connected to the first portion through the first interconnection member,
- the conductor portion further includes a second interconnection member,
- the bonding material further includes a third bonding material for bonding the first conductor plate to the second interconnection member,
- the third bonding material includes
- a third portion interposed between the first conductor plate and the second interconnection member, and
- a fourth portion connected to the third portion through the second interconnection member,
- the semiconductor element further includes a second power element having a third surface and a fourth surface opposite to each other,
- the heat dissipation plate further includes a second conductor plate bonded to the fourth surface of the second power element with the second conductor plate being separated from the first conductor plate by a distance,
- the bonding material further includes
- a fourth bonding material for bonding the third surface of the second power element to the second conductor plate, and
- a fifth bonding material for bonding the fourth surface of the second power element to the second interconnection member, and
- the fifth bonding material includes
- a fifth portion interposed between the fourth surface of the second power element and the second interconnection member, and
- a sixth portion connected to the fifth portion through the second interconnection member.
Dependencies are inferred from the claim text.