Optical line testing device using wavelength tunable laser to measure cutting position of optical line
AssigneeSOLiD, INC.
InventorKeewoon Na
Life of this patent
Estimating the term…
Abstract
An optical line testing device for measuring at least a cutting position of an optical line according to the present invention includes: a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically; a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time; and an interferometer configured to cause interference between a reflected optical signal, corresponding to the first optical signal, which is returning after having been emitted to the optical line, and the second optical signal to output an interference signal.
Claims15
An optical line testing device for measuring at least one cutting position of an optical line, the optical line testing device comprising:
- a first wavelength tunable laser source configured to generate a first optical signal in which a plurality of wavelengths appear alternately and periodically such that each wavelength appears repeatedly at a wavelength repetition period, and output the generated first optical signal to the optical line;
- a second wavelength tunable laser source configured to generate a second optical signal which is identical to the first optical signal but has an adjustable delay time;
- an interferometer configured to cause interference between a reflected optical signal of the first optical signal reflected from the optical line and the second optical signal, and output an interference signal caused by the interference between the reflected optical signal and the second optical signal;
- and
- a processor configured to adjust the delay time of the second optical signal and measure the cutting position based on the interference signal and the delay time.
An optical line testing device for measuring at least one cutting position of an optical line, the optical line testing device comprising:
- a first wavelength tunable laser source controlled by a first wavelength control signal and configured to:
- generate a first optical signal in which a plurality of wavelengths appear alternately and periodically such that each wavelength appears repeatedly at a wavelength repetition period, and
- output the generated first optical signal to the optical line;
- a second wavelength tunable laser source controlled by a second wavelength control signal which is identical to the first wavelength control signal but has a delay time to generate a second optical signal;
- and
- an interferometer configured to output an interference signal by causing interference between a reflected optical signal of the first optical signal from the optical line and the second optical signal;
- and
- a processor configured to adjust the delay time of the second optical signal and measure the cutting position based on the interference signal and the delay time.
Dependencies are inferred from the claim text.