Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

A surface sensing system for imaging a scanned surface of a sample, the system comprising:

• a sample holder including a support surface configured to support the sample;
• a visible light source configured to direct a visible light beam incident upon a sampled location on the scanned surface when the sample is supported by the support surface;
• a tunable infrared (IR) source configured to direct a tunable IR beam coincident with the visible light beam incident upon the sampled location on the scanned surface when the sample is supported by the support surface, wherein the tunable IR source further is configured to selectively vary a wavelength of the tunable IR beam to permit the tunable IR beam to selectively induce resonance within an imaged structure that is positioned on the scanned surface;
• a scanning structure configured to scan the visible light beam and the tunable IR beam across the scanned surface to selectively vary a portion of the scanned surface that defines the sampled location, wherein the scanning structure is configured to at least one of:
• (i) concurrently move both the visible light beam and the tunable IR beam relative to the scanned surface;
• (ii) operatively translate the sample holder relative to both the visible light beam and the tunable IR beam;
• (iii) move the visible light source independently of the tunable IR source;
• and
• (iv) move the IR source independently of the visible light source;
• a light filter configured to receive an emitted light beam, which includes a sum frequency signal between the visible light beam and the tunable IR beam, from the scanned surface and to filter the emitted light beam to generate a filtered light beam, wherein the emitted light beam is emitted from the scanned surface responsive to both the visible light beam and the tunable IR beam being incident on the scanned surface;
• a light detection system configured to receive the filtered light beam from the light filter;
• and
• an alignment structure configured to operatively align at least two of:
• (i) the visible light source;
• (ii) the tunable IR source;
• (iii) the sample holder;
• (iv) the light detection system;
• and
• (v) the light filter.