Specimen analyzing method and specimen analyzing apparatus
AssigneeSysmex Corporation
InventorsNorimasa Yamamoto, Takashi Yamato, Naohiko Matsuo, Satoshi Iguchi
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Abstract
A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
Claims23
A specimen analyzing method comprising:
- acquiring information about an amount of an interference substance of a specimen;
- analyzing the specimen for measurement items;
- and
- outputting, on a display, a plurality of measurement item symbols corresponding to the measurement items and an indication associated with a measurement item symbol, from among the plurality of measurement item symbols, for a measurement item which the information about the amount of the interference substance meets a condition.
A specimen analyzing apparatus comprising:
- a display;
- an optical sensor configured to acquire information about an amount of an interference substance of a specimen;
- and
- at least one processor configured to analyze the specimen for measurement items;
- and control the display to output a plurality of measurement item symbols corresponding to the measurement items and an indication associated with a measurement item symbol, from among the plurality of measurement item symbols, for a measurement item which the information about the amount of the interference substance meets a condition.
Dependencies are inferred from the claim text.