Failure determination circuit, physical quantity measurement device, electronic apparatus, vehicle, and failure determination method
AssigneeSeiko Epson Corporation
InventorNoriyuki Murashima
Life of this patent
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AssigneeSeiko Epson Corporation
InventorNoriyuki Murashima
Estimating the term…
A failure determination circuit includes a first A/D conversion circuit that continuously A/D converts a first analog signal based on a first physical quantity measurement signal, a switching circuit that receives a plurality of signals including a second analog signal based on the first physical quantity measurement signal and a first reference voltage and outputs the plurality of signals in a time division manner, a second A/D conversion circuit that A/D converts the output of the switching circuit, and a determination circuit, and the determination circuit determines a failure of the first A/D conversion circuit using a signal based on a first digital signal obtained by A/D converting the first analog signal by the first A/D conversion circuit and a signal based on a second digital signal obtained by A/D converting the second analog signal by the second A/D conversion circuit.
A failure determination circuit comprising:
A failure determination method comprising:
Dependencies are inferred from the claim text.