Driving device for semiconductor elements
AssigneeFuji Electric Co., Ltd.
InventorNaoki Shimizu
Life of this patent
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Abstract
To provide a driving device for semiconductor elements that is capable of suppressing variation in switching time caused by driving capability and temperature. A driving device for semiconductor elements includes: a semiconductor chip in which a voltage control type semiconductor element is formed; a temperature detecting unit configured to detect temperature of the semiconductor chip; a driving-capability adjusting unit configured to adjust driving capability of the voltage control type semiconductor element according to temperature detection values detected by the temperature detecting unit; and a timing adjusting unit configured to adjust switching time of the voltage control type semiconductor element according to the temperature detection values detected by the temperature detecting unit.
Claims7
A driving device for semiconductor elements comprising:
- a semiconductor chip in which a voltage control type semiconductor element is formed;
- a temperature detector configured to detect a temperature of the semiconductor chip;
- a driving-capability adjusting circuit configured to output a signal to adjust a driving capability of the voltage control type semiconductor element based on the temperature detected by the temperature detector;
- and
- a timing adjusting circuit configured to adjust a switching time of the voltage control type semiconductor element so as to lengthen a delay time of a rise of a driving signal for the voltage control type semiconductor element as the temperature detected by the temperature detector becomes higher.
A driving device for semiconductor elements comprising:
- a semiconductor chip in which a voltage control type semiconductor element is formed;
- a temperature detector configured to detect a temperature of the semiconductor chip;
- a driving-capability adjusting circuit configured to adjust a driving capability of the voltage control type semiconductor element based on the temperature detected by the temperature detector;
- and
- a timing adjusting circuit configured to adjust a switching time of the voltage control type semiconductor element based on the temperature detected by the temperature detector, the timing adjusting circuit being configured with a variable delay circuit capable of adjusting a delay time based on temperature.
A driving device comprising:
- a semiconductor chip having a voltage control type semiconductor element;
- a temperature detector configured to detect a temperature of the semiconductor chip;
- a driving-capability adjusting circuit configured to adjust a driving capability of the voltage control type semiconductor element in response to the temperature detected by the temperature detector;
- and
- a timing adjusting circuit configured to suppress a variation of a switching time of the voltage control type semiconductor element in response to the detected temperature and the adjusted driving capability.
Dependencies are inferred from the claim text.