Capped magnetic memory
AssigneeIntel Corporation
InventorsDaniel R. Lamborn, Oleg Golonzka, Christopher J. Wiegand, Philip E. Heil, M D Tofizur Rahman, Rebecca J. Castellano, Tarun Bansal
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AssigneeIntel Corporation
InventorsDaniel R. Lamborn, Oleg Golonzka, Christopher J. Wiegand, Philip E. Heil, M D Tofizur Rahman, Rebecca J. Castellano, Tarun Bansal
Estimating the term…
An embodiment includes an apparatus comprising: a magnetic tunnel junction (MTJ), between first and second electrodes, comprising a dielectric layer between fixed and free layers; a dielectric film directly contacting sidewalls of the first electrode; and a metallic layer coupled to the sidewalls via the dielectric film; wherein (a) a vertical axis intersects the first and second electrodes and the MTJ but not the metallic layer, (b) a first horizontal axis intersects the metallic layer, the dielectric film, and the first electrode; and (c) a second horizontal axis, between the first horizontal axis and the MTJ, intersects the dielectric film and the first electrode but not the capping layer. Other embodiments are described herein.
An apparatus comprising:
An apparatus comprising:
Dependencies are inferred from the claim text.